| Circuit-level layout-aware modeling of single-event effects in 65-nm CMOS ICs AO Balbekov, MS Gorbunov, GI Zebrev IEEE Transactions on Nuclear Science 65 (8), 1914-1919, 2018 | 19 | 2018 |
| DICE-based Muller C-elements for soft error tolerant asynchronous ICs IA Danilov, MS Gorbunov, AI Shnaider, AO Balbekov, YB Rogatkin, ... 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 19 | 2016 |
| On board electronic devices safety provided by DICE-based Muller C-elements IA Danilov, MS Gorbunov, AI Shnaider, AO Balbekov, YB Rogatkin, ... Acta Astronautica 150, 28-32, 2018 | 17 | 2018 |
| Standard verification flow compatible layout-aware fault injection technique for single event effects tolerant ASIC design IA Danilov, AIS Khazanova, AO Balbekov, MS Gorbunov 2019 19th European Conference on Radiation and Its Effects on Components and …, 2019 | 4 | 2019 |
| Comparative Analysis of Layout-Aware Fault Injection on TMR-based DMA Controllers P Chernyakov, A Skorobogatov, A Zvyagin, E Emin, I Danilov, A Balbekov, ... 2019 IEEE 31st International Conference on Microelectronics (MIEL), 289-292, 2019 | 4 | 2019 |
| Estimation technique for SET-tolerance of combinational ICs A Balbekov, M Gorbunov International Conference on Micro-and Nano-Electronics 2014 9440, 375-381, 2014 | 4 | 2014 |
| Design-stage hardening of 65-nm cmos standard cells against multiple events AO Balbekov, MS Gorbunov, AM Galimov IEEE Transactions on Nuclear Science 68 (8), 1712-1718, 2021 | 2 | 2021 |
| Layout-aware soft error rate estimation technique for integrated circuits under the environment with energetic charged particles AO Balbekov, MS Gorbunov, SG Bobkov Journal of Physics: Conference Series 798 (1), 012209, 2017 | 2 | 2017 |
| Layout-aware simulation of soft errors in sub-100 nm integrated circuits A Balbekov, M Gorbunov, S Bobkov International Conference on Micro-and Nano-Electronics 2016 10224, 305-310, 2016 | 2 | 2016 |
| SiGe BiCMOS Voltage-Controlled Oscillator and Mixer IP-blocks for the Next-Generation Communication Transceivers IA Selishchev, DI Sotskov, AG Kuznetsov, NA Usachev, VV Elesin, ... 2021 IEEE 32nd International Conference on Microelectronics (MIEL), 239-242, 2021 | 1 | 2021 |
| SPICE-level layout-aware single event effects simulation of majority voters AO Balbekov, MS Gorbunov, GI Zebrev 2017 IEEE 30th International Conference on Microelectronics (MIEL), 333-336, 2017 | 1 | 2017 |
| Application of the layout-aware single event simulations to a design of 65 nm memory units AO Balbekov 2018 Moscow Workshop on Electronic and Networking Technologies (MWENT), 1-4, 2018 | | 2018 |
| Development of fault-tolerant triggers on 65 nm CMOS technology; Razrabotka sboeustojchivykh triggerov na 65 nm KMOP tekhnologii AO Balbekov, VE Shunkov, PS Dolotov | | 2013 |
| Development of fault-tolerant triggers on 65 nm CMOS technology AO Balbekov, VE Shunkov, PS Dolotov Scientific session of NRNU MEPHI-2013. Abstracts. In three volumes. Volume 1 …, 2013 | | 2013 |
