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Daniel Limbrick
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Modeling of Single Event Transients with Dual Double-Exponential Current Sources: Implications for Logic Cell Characterization
DA Black, WH Robinson, I Wilcox, DB Limbrick, JD Black
IEEE Transactions on Nuclear Science 62 (4), 1540-1549, 2015
1232015
Power benefit study for ultra-high density transistor-level monolithic 3D ICs
YJ Lee, D Limbrick, SK Lim
Proceedings of the 50th Annual Design Automation Conference, 1-10, 2013
802013
Reliability-aware synthesis of combinational logic with minimal performance penalty
DB Limbrick, NN Mahatme, WH Robinson, BL Bhuva
IEEE Transactions on Nuclear Science, 2012
412012
Design comparison to identify malicious hardware in external intellectual property
T Reece, DB Limbrick, WH Robinson
2011IEEE 10th International Conference on Trust, Security and Privacy in …, 2011
292011
Impact of logic synthesis on soft error vulnerability using a 90-nm bulk CMOS digital cell library
DB Limbrick, DA Black, K Dick, NM Atkinson, NJ Gaspard, JD Black, ...
2011 Proceedings of IEEE Southeastcon, 430-434, 2011
242011
Stealth assessment of hardware Trojans in a microcontroller
T Reece, DB Limbrick, X Wang, BT Kiddie, WH Robinson
2012 IEEE 30th International Conference on Computer Design (ICCD), 139-142, 2012
222012
Impact of synthesis constraints on error propagation probability of digital circuits
DB Limbrick, S Yue, WH Robinson, BL Bhuva
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2011
192011
Characterizing single event transient pulse widths in an open-source cell library using SPICE
DB Limbrick, WH Robinson
IEEE Workshop on Silicon Errors in Logic-System Effects (SELSE), 2012
182012
Design and implementation of an autonomous wireless sensor-based smart home
C Osiegbu, SB Amsalu, F Afghah, D Limbrick, A Homaifar
2015 24th International Conference on Computer Communication and Networks …, 2015
162015
Single-event multiple-transient characterization and mitigation via alternative standard cell placement methods
BT Kiddie, WH Robinson, DB Limbrick
ACM Transactions on Design Automation of Electronic Systems (TODAES) 20 (4 …, 2015
152015
Single-event multiple-transients (SEMT): Circuit characterization and analysis
BT Kiddie, WH Robinson, DB Limbrick
IEEE Workshop Silicon Errors in Logic-System Effects (SELSE), 2013
152013
An efficient technique to select logic nodes for single event transient pulse-width reduction
NN Mahatme, I Chatterjee, A Patki, DB Limbrick, BL Bhuva, RD Schrimpf, ...
Microelectronics Reliability 53 (1), 114-117, 2013
132013
Soft-error mitigation at the architecture-level using berger codes and instruction repetition
EJ Ossi, DB Limbrick, WH Robinson, BL Bhuva
Proceedings of the IEEE Workshop on Silicon Errors in Logic–System Effects …, 2009
62009
Effects of voltage and temperature variations on the electrical masking capability of sub-65 nm combinational logic circuits
SA Olowogemo, WH Robinson, DB Limbrick
2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2018
42018
Impact of logic synthesis on soft error rate of digital integrated circuits
DB Limbrick
2012 IEEE Computer Society Annual Symposium on VLSI, 3-4, 2012
42012
Performance evaluation of a secure microkernel on a single-board computer
YB Bekele, DB Limbrick
2020 SoutheastCon, 1-2, 2020
32020
Evaluating the Impact of Hardware Faults on Program Execution in a Microkernel Environment
YB Bekele, DB Limbrick
2022 IEEE International Symposium on Hardware Oriented Security and Trust …, 2022
22022
Rowhammer attacks on the raspberry Pi 3B+
Y Bekele, A Yiwere, DB Limbrick
Government Microcircuit Applications & Critical Technologies Conference, 2021
22021
Electrical masking improvement with standard logic cell synthesis using 45 nm technology node
SA Olowogemo, A Yiwere, BT Lin, H Qiu, WH Robinson, DB Limbrick
2020 IEEE 63rd International Midwest Symposium on Circuits and Systems …, 2020
22020
Gem5Panalyzer: a light-weight tool for early-stage architectural reliability evaluation & prediction
H Qiu, X Qiu, SA Olowogemo, BT Lin, WH Robinson, DB Limbrick
2020 IEEE 63rd International Midwest Symposium on Circuits and Systems …, 2020
22020
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Articles 1–20