Modeling of Single Event Transients with Dual Double-Exponential Current Sources: Implications for Logic Cell Characterization DA Black, WH Robinson, I Wilcox, DB Limbrick, JD Black IEEE Transactions on Nuclear Science 62 (4), 1540-1549, 2015 | 123 | 2015 |
Power benefit study for ultra-high density transistor-level monolithic 3D ICs YJ Lee, D Limbrick, SK Lim Proceedings of the 50th Annual Design Automation Conference, 1-10, 2013 | 80 | 2013 |
Reliability-aware synthesis of combinational logic with minimal performance penalty DB Limbrick, NN Mahatme, WH Robinson, BL Bhuva IEEE Transactions on Nuclear Science, 2012 | 41 | 2012 |
Design comparison to identify malicious hardware in external intellectual property T Reece, DB Limbrick, WH Robinson 2011IEEE 10th International Conference on Trust, Security and Privacy in …, 2011 | 29 | 2011 |
Impact of logic synthesis on soft error vulnerability using a 90-nm bulk CMOS digital cell library DB Limbrick, DA Black, K Dick, NM Atkinson, NJ Gaspard, JD Black, ... 2011 Proceedings of IEEE Southeastcon, 430-434, 2011 | 24 | 2011 |
Stealth assessment of hardware Trojans in a microcontroller T Reece, DB Limbrick, X Wang, BT Kiddie, WH Robinson 2012 IEEE 30th International Conference on Computer Design (ICCD), 139-142, 2012 | 22 | 2012 |
Impact of synthesis constraints on error propagation probability of digital circuits DB Limbrick, S Yue, WH Robinson, BL Bhuva 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2011 | 19 | 2011 |
Characterizing single event transient pulse widths in an open-source cell library using SPICE DB Limbrick, WH Robinson IEEE Workshop on Silicon Errors in Logic-System Effects (SELSE), 2012 | 18 | 2012 |
Design and implementation of an autonomous wireless sensor-based smart home C Osiegbu, SB Amsalu, F Afghah, D Limbrick, A Homaifar 2015 24th International Conference on Computer Communication and Networks …, 2015 | 16 | 2015 |
Single-event multiple-transient characterization and mitigation via alternative standard cell placement methods BT Kiddie, WH Robinson, DB Limbrick ACM Transactions on Design Automation of Electronic Systems (TODAES) 20 (4 …, 2015 | 15 | 2015 |
Single-event multiple-transients (SEMT): Circuit characterization and analysis BT Kiddie, WH Robinson, DB Limbrick IEEE Workshop Silicon Errors in Logic-System Effects (SELSE), 2013 | 15 | 2013 |
An efficient technique to select logic nodes for single event transient pulse-width reduction NN Mahatme, I Chatterjee, A Patki, DB Limbrick, BL Bhuva, RD Schrimpf, ... Microelectronics Reliability 53 (1), 114-117, 2013 | 13 | 2013 |
Soft-error mitigation at the architecture-level using berger codes and instruction repetition EJ Ossi, DB Limbrick, WH Robinson, BL Bhuva Proceedings of the IEEE Workshop on Silicon Errors in Logic–System Effects …, 2009 | 6 | 2009 |
Effects of voltage and temperature variations on the electrical masking capability of sub-65 nm combinational logic circuits SA Olowogemo, WH Robinson, DB Limbrick 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2018 | 4 | 2018 |
Impact of logic synthesis on soft error rate of digital integrated circuits DB Limbrick 2012 IEEE Computer Society Annual Symposium on VLSI, 3-4, 2012 | 4 | 2012 |
Performance evaluation of a secure microkernel on a single-board computer YB Bekele, DB Limbrick 2020 SoutheastCon, 1-2, 2020 | 3 | 2020 |
Evaluating the Impact of Hardware Faults on Program Execution in a Microkernel Environment YB Bekele, DB Limbrick 2022 IEEE International Symposium on Hardware Oriented Security and Trust …, 2022 | 2 | 2022 |
Rowhammer attacks on the raspberry Pi 3B+ Y Bekele, A Yiwere, DB Limbrick Government Microcircuit Applications & Critical Technologies Conference, 2021 | 2 | 2021 |
Electrical masking improvement with standard logic cell synthesis using 45 nm technology node SA Olowogemo, A Yiwere, BT Lin, H Qiu, WH Robinson, DB Limbrick 2020 IEEE 63rd International Midwest Symposium on Circuits and Systems …, 2020 | 2 | 2020 |
Gem5Panalyzer: a light-weight tool for early-stage architectural reliability evaluation & prediction H Qiu, X Qiu, SA Olowogemo, BT Lin, WH Robinson, DB Limbrick 2020 IEEE 63rd International Midwest Symposium on Circuits and Systems …, 2020 | 2 | 2020 |