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Anbarasu Manivannan
Anbarasu Manivannan
Professor, Department of Electrical Engineering, Indian Institute of Technology Madras
Verified email at ee.iitm.ac.in
Title
Cited by
Cited by
Year
Nanosecond threshold switching of GeTe6 cells and their potential as selector devices
M Anbarasu, M Wimmer, G Bruns, M Salinga, M Wuttig
Applied Physics Letters 100 (14), 2012
1442012
Structural study on amorphous and crystalline state of phase change material
M Upadhyay, S Murugavel, M Anbarasu, TR Ravindran
Journal of Applied Physics 110 (8), 2011
672011
Microstructure, mechanical properties and shape memory behaviour of friction stir welded nitinol
SSM Prabu, HC Madhu, CS Perugu, K Akash, PA Kumar, SV Kailas, ...
Materials Science and Engineering: A 693, 233-236, 2017
522017
Redefining the speed limit of phase change memory revealed by time-resolved steep threshold-switching dynamics of AgInSbTe devices
KD Shukla, N Saxena, S Durai, A Manivannan
Scientific Reports 6 (1), 37868, 2016
402016
Exploring ultrafast threshold switching in In3SbTe2 phase change memory devices
N Saxena, C Persch, M Wuttig, A Manivannan
Scientific reports 9 (1), 19251, 2019
362019
Shape memory effect, temperature distribution and mechanical properties of friction stir welded nitinol
SSM Prabu, HC Madhu, CS Perugu, K Akash, R Mithun, PA Kumar, ...
Journal of Alloys and Compounds 776, 334-345, 2019
342019
Low power ovonic threshold switching characteristics of thin GeTe6 films using conductive atomic force microscopy
A Manivannan, SK Myana, K Miriyala, S Sahu, R Ramadurai
Applied Physics Letters 105 (24), 2014
302014
Influence of fluence, beam overlap and aging on the wettability of pulsed Nd3+: YAG nanosecond laser-textured Cu and Al sheets
YEB Vidhya, A Pattamatta, A Manivannan, NJ Vasa
Applied Surface Science 548, 149259, 2021
282021
The influence of network rigidity on the electrical switching behaviour of Ge–Te–Si glasses suitable for phase change memory applications
M Anbarasu, S Asokan
Journal of Physics D: Applied Physics 40 (23), 7515, 2007
282007
Electrical switching behavior of bulk As–Te–Si glasses: composition dependence and topological effects
M Anbarasu, S Asokan
Applied Physics A 80, 249-252, 2005
222005
Electrical switching and in situ Raman scattering studies on the set-reset processes in Ge–Te–Si glass
M Anbarasu, S Asokan, S Prusty, AK Sood
Applied Physics Letters 91 (9), 2007
212007
Local structure of amorphous Ag5In5Sb60Te30 and In3SbTe2 phase change materials revealed by X-ray photoelectron and Raman spectroscopic studies
S Sahu, A Manivannan, H Shaik, G Mohan Rao
Journal of Applied Physics 122 (1), 2017
202017
Impact of thermal boundary resistance on the performance and scaling of phase-change memory device
S Durai, S Raj, A Manivannan
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2019
192019
Understanding the structure and properties of phase change materials for data storage applications
M Anbarasu, M Wuttig
Journal of the Indian Institute of Science 91 (2), 259-274, 2011
182011
Laser assisted wet texturing of flexible polyethylene terephthalate substrate using Nd3+: YAG laser for photovoltaics devices
AK Shukla, K Akash, IA Palani, A Manivannan
Materials Science and Engineering: B 226, 78-85, 2017
17*2017
Femtosecond laser-induced ultrafast transient snapshots and crystallization dynamics in phase change material
S Sahu, R Sharma, KV Adarsh, A Manivannan
Optics Letters 42 (13), 2503-2506, 2017
152017
Direct evidence for structural transformation and higher thermal stability of amorphous insbte phase change material
SK Pandey, A Manivannan
Scripta Materialia 192, 73-77, 2021
142021
Multilevel accumulative switching processes in growth-dominated AgInSbTe phase change material
MS Arjunan, A Mondal, A Das, KV Adarsh, A Manivannan
Optics Letters 44 (12), 3134-3137, 2019
142019
Extremely High Contrast Multi‐Level Resistance States of In3SbTe2 Device for High Density Non‐Volatile Memory Applications
SK Pandey, A Manivannan
physica status solidi (RRL)–Rapid Research Letters 11 (9), 1700227, 2017
142017
Evidence for a thermally reversing window in bulk Ge–Te–Si glasses revealed by alternating differential scanning calorimetry
M Anbarasu, KK Singh, S Asokan
Philosophical Magazine 88 (4), 599-605, 2008
142008
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