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Co-authors
In-Cheol ParkProfessor of Electrical Engineering, KAISTVerified email at kaist.edu
Youngjoo LeeAssociate Professor, Pohang University of Science and Technology (POSTECH)Verified email at postech.ac.kr
Dongyun KamPOSTECHVerified email at postech.ac.kr
Hoyoung YooAssistant professor, Chungnam National UniversityVerified email at cnu.ac.kr
Jihyuck JoKorea Advanced Institute of Science and TechnologyVerified email at kaist.ac.kr
Bongjin KimSamsung ElectronicsVerified email at samsung.com
Sangbu YunPOSTECH E.E.Verified email at postech.ac.kr
Suchang KimKorea Advanced Institute of Science and Technology (KAIST)Verified email at ics.kaist.ac.kr
Jaewoong ChoiSchool of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST)Verified email at ics.kaist.ac.kr
Jooseung LeeKorea Electrotechnology Research Institute (KERI)Verified email at keri.re.kr
Jaehwan JungElectrical Engineering, KAISTVerified email at kaist.ac.kr
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Byeong Yong Kong
Associate Professor, Kongju National University
Verified email at kongju.ac.kr - Homepage