| Modeling of radiation-induced leakage and low dose-rate effects in thick edge isolation of modern MOSFETs GI Zebrev, MS Gorbunov IEEE Transactions on Nuclear Science 56 (4), 2230-2236, 2009 | 76 | 2009 |
| Design of 65 nm CMOS SRAM for space applications: A comparative study MS Gorbunov, PS Dolotov, AA Antonov, GI Zebrev, VV Emeliyanov, ... Radiation and Its Effects on Components and Systems (RADECS), 2013 14th …, 2013 | 71 | 2013 |
| The GAMMA-400 experiment: Status and prospects NP Topchiev, AM Galper, V Bonvicini, O Adriani, RL Aptekar, ... Bulletin of the Russian Academy of Sciences: Physics 79 (3), 417-420, 2015 | 46 | 2015 |
| SET Tolerance of 65 nm CMOS Majority Voters: A Comparative Study IA Danilov, MS Gorbunov, AA Antonov IEEE, 2014 | 45 | 2014 |
| Temperature Dependence of MCU Sensitivity in 65 nm CMOS SRAM AB Boruzdina, AV Sogoyan, AA Smolin, AV Ulanova, MS Gorbunov, ... IEEE Transactions on Nuclear Science 62 (6), 2860-2866, 2015 | 44 | 2015 |
| The GAMMA-400 gamma-ray telescope for precision gamma-ray emission investigations NP Topchiev, AM Galper, V Bonvicini, O Adriani, RL Aptekar, ... Journal of Physics: Conference Series 675 (3), 032009, 2016 | 34 | 2016 |
| Analysis of SOI CMOS microprocessor's SEE sensitivity: Correlation of the results obtained by different test methods MS Gorbunov, BV Vasilegin, AA Antonov, PN Osipenko, GI Zebrev, ... IEEE Transactions on Nuclear Science 59 (4), 1130-1135, 2012 | 29 | 2012 |
| Statistics and methodology of multiple cell upset characterization under heavy ion irradiation GI Zebrev, MS Gorbunov, RG Useinov, VV Emeliyanov, AI Ozerov, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2015 | 28 | 2015 |
| Microdose Induced Drain Leakage Effects in Power Trench MOSFETs: Experiment and Modeling GI Zebrev, RG Useinov, AS Vatuev, VV Emeliyanov, VS Anashin, ... | 22 | 2013 |
| Verilog-a modeling of radiation-induced mismatch enhancement MS Gorbunov, IA Danilov, GI Zebrev, PN Osipenko IEEE Transactions on Nuclear Science 58 (3), 785-792, 2011 | 21 | 2011 |
| Circuit-level layout-aware modeling of single-event effects in 65-nm CMOS ICs AO Balbekov, MS Gorbunov, GI Zebrev IEEE Transactions on Nuclear Science 65 (8), 1914-1919, 2018 | 19 | 2018 |
| DICE-based muller C-elements for soft error tolerant asynchronous ICs IA Danilov, MS Gorbunov, AI Shnaider, AO Balbekov, YB Rogatkin, ... 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 19 | 2016 |
| High-energy gamma-ray studying with GAMMA-400 after Fermi-LAT NP Topchiev, AM Galper, V Bonvicini, O Adriani, IV Arkhangelskaja, ... Journal of Physics: Conference Series 798 (1), 012011, 2017 | 17 | 2017 |
| Multiple cell upset cross-section uncertainty in nanoscale memories: Microdosimetric approach GI Zebrev, KS Zemtsov, RG Useinov, MS Gorbunov, VV Emeliyanov, ... 2015 15th European Conference on Radiation and Its Effects on Components and …, 2015 | 17 | 2015 |
| On board electronic devices safety provided by DICE-based Muller C-elements IA Danilov, MS Gorbunov, AI Shnaider, AO Balbekov, YB Rogatkin, ... Acta Astronautica 150, 28-32, 2018 | 16 | 2018 |
| Physical modeling and circuit simulation of hardness of SOI transistors and circuits for space applications GI Zebrev, MS Gorbunov, VE Shunkov, EA Gagarin, AV Khakhaev, ... report presented to RADECS, 2006 | 16 | 2006 |
| Physics-based modeling of TID induced global static leakage in different CMOS circuits GI Zebrev, VV Orlov, MS Gorbunov, MG Drosdetsky Microelectronics Reliability 84, 181-186, 2018 | 15 | 2018 |
| Separation of electrons and protons in the GAMMA-400 gamma-ray telescope AA Leonov, AM Galper, V Bonvicini, NP Topchiev, O Adriaini, RL Aptekar, ... Advances in Space Research 56 (7), 1538-1545, 2015 | 15 | 2015 |
| Fault-Tolerant SOI Microprocessor for Space Applications PN Osipenko, AA Antonov, AV Klishin, BV Vasilegin, MS Gorbunov, ... IEEE, 2013 | 14 | 2013 |
| GAMMA-400 gamma-ray observatory NP Topchiev, AM Galper, V Bonvicini, O Adriani, RL Aptekar, ... arXiv preprint arXiv:1507.06246, 2015 | 13 | 2015 |
Anton BalbekovEngineer, NIISIVerified email at cs.niisi.ras.ru
