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Alexander Shard
Alexander Shard
Verified email at npl.co.uk
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Cited by
Cited by
Year
Effect of crystallization on the electronic energy levels and thin film morphology of P3HT: PCBM blends
WC Tsoi, SJ Spencer, L Yang, AM Ballantyne, PG Nicholson, A Turnbull, ...
Macromolecules 44 (8), 2944-2952, 2011
3082011
ARXPS characterisation of plasma polymerised surface chemical gradients
KL Parry, AG Shard, RD Short, RG White, JD Whittle, A Wright
Surface and Interface Analysis: An International Journal devoted to the …, 2006
3072006
Detection limits in XPS for more than 6000 binary systems using Al and Mg Kα X‐rays
AG Shard
Surface and Interface Analysis 46 (3), 175-185, 2014
2482014
XPS and AFM surface studies of solvent-cast PS/PMMA blends
C Ton-That, AG Shard, DOH Teare, RH Bradley
Polymer 42 (3), 1121-1129, 2001
2472001
Emerging techniques for submicrometer particle sizing applied to Stober silica
NC Bell, C Minelli, J Tompkins, MM Stevens, AG Shard
Langmuir 28 (29), 10860-10872, 2012
1812012
Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions
JLS Lee, S Ninomiya, J Matsuo, IS Gilmore, MP Seah, AG Shard
Analytical chemistry 82 (1), 98-105, 2010
1802010
Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements
DR Baer, K Artyushkova, C Richard Brundle, JE Castle, MH Engelhard, ...
Journal of Vacuum Science & Technology A 37 (3), 2019
1752019
Practical guides for x-ray photoelectron spectroscopy: Quantitative XPS
AG Shard
Journal of Vacuum Science & Technology A 38 (4), 2020
1742020
A NEXAFS examination of unsaturation in plasma polymers of allylamine and propylamine
G Alexander, JD Whittle, AJ Beck, PN Brookes, NA Bullett, RA Talib, ...
The Journal of Physical Chemistry B 108 (33), 12472-12480, 2004
1682004
Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study
AG Shard, R Havelund, MP Seah, SJ Spencer, IS Gilmore, N Winograd, ...
Analytical chemistry 84 (18), 7865-7873, 2012
1592012
Effects of annealing on the surface composition and morphology of PS/PMMA blend
C Ton-That, AG Shard, R Daley, RH Bradley
Macromolecules 33 (22), 8453-8459, 2000
1582000
A straightforward method for interpreting XPS data from core–shell nanoparticles
AG Shard
The Journal of Physical Chemistry C 116 (31), 16806-16813, 2012
1542012
Thickness of spin-cast polymer thin films determined by angle-resolved XPS and AFM tip-scratch methods
C Ton-That, AG Shard, RH Bradley
Langmuir 16 (5), 2281-2284, 2000
1542000
Quantitative analysis of adsorbed proteins by X-ray photoelectron spectroscopy
S Ray, AG Shard
Analytical chemistry 83 (22), 8659-8666, 2011
1472011
Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials
AG Shard, PJ Brewer, FM Green, IS Gilmore
Surface and Interface Analysis: An International Journal devoted to the …, 2007
1422007
Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS
G Alexander, FM Green, PJ Brewer, MP Seah, IS Gilmore
The Journal of Physical Chemistry B 112 (9), 2596-2605, 2008
1412008
Synthesis and characterization of segmented polyurethanes based on amphiphilic polyether diols
PN Lan, S Corneillie, E Schacht, M Davies, A Shard
Biomaterials 17 (23), 2273-2280, 1996
1171996
Size and ζ-potential measurement of silica nanoparticles in serum using tunable resistive pulse sensing
A Sikora, AG Shard, C Minelli
Langmuir 32 (9), 2216-2224, 2016
1132016
Surface analysis of biodegradable polymer blends of poly (sebacic anhydride) and poly (DL-lactic acid)
MC Davies, KM Shakesheff, AG Shard, A Domb, CJ Roberts, SJB Tendler, ...
Macromolecules 29 (6), 2205-2212, 1996
1101996
Surface feature size of spin cast PS/PMMA blends
C Ton-That, AG Shard, RH Bradley
Polymer 43 (18), 4973-4977, 2002
1002002
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