| Finite Element Based Surface Roughness Study for Ohmic Contact of Microswitches H Liu, D Leray, S Colin, P Pons, A Broué 58th IEEE Holm Conference on Electrical Contacts (Holm), 1-10, 2012 | 43 | 2012 |
| A Finite-Element-Based Contact Resistance Model for Rough Surfaces: Applied to a Bilayered Au/MWCNT Composite H Liu, JW McBride IEEE Transactions on Components, Packaging and Manufacturing Technology, 2018 | 17 | 2018 |
| Finite element model of a bi-layered gold coated carbon nanotube composite surface H Liu, JW McBride, SH Down, Michael P. and Pu IEEE Transactions on Components Packaging and Manufacturing Technology 5 (6 …, 2015 | 17 | 2015 |
| A Comparison of the Predictions of a Finite Element Model and Multiscale Model for a Rough MEMS Electrical Contact RL Jackson, H Liu, D Leray 59th IEEE Holm Conference on Electrical Contacts (HOLM), 1-9, 2013 | 14 | 2013 |
| Finite-element contact modeling of rough surfaces applied to Au-coated carbon nanotube composites H Liu, JW McBride IEEE Transactions on Components, Packaging and Manufacturing Technology 7 (3 …, 2017 | 13 | 2017 |
| Finite element multi-physics modeling for ohmic contact of microswitches H Liu, D Leray, P Pons, S Colin IEEE 15th international conference on Thermal, Mechanical and Multi-physics …, 2014 | 11 | 2014 |
| A Comparison of the Predictions of a Multiscale Model and Optical Real Area of Contact Measurements RL Jackson, MP Down, H Liu, JW McBride 60th IEEE Holm Conference on Electrical Contacts (HOLM), 1-8, 2014 | 10 | 2014 |
| Mechanical characterization of a Au coated carbon nanotube multi-layered structure H Liu, MP Down, JW McBride, SH Pu, L Jiang 60th IEEE Holm Conference on Electrical Contacts (HOLM), 1-9, 2014 | 10 | 2014 |
| The relationship between contact resistance and roughness (Sq) of a bi-layered surface using a finite element model JW McBride, H Liu 2020 IEEE 66th Holm Conference on Electrical Contacts and Intensive Course …, 2020 | 7 | 2020 |
| Surface characterization of a Au/CNT composite for a MEMS switching application H Liu, JW McBride, MZM Yusop Nanotechnology (IEEE-NANO), 2016 IEEE 16th International Conference on, 751-754, 2016 | 7 | 2016 |
| A finite element based electrical resistance study for rough surfaces: Applied to a bi-layered Au/MWCNT composite for micro-switching applications H Liu, JW McBride Electrical Contacts (Holm), 2016 IEEE 62nd Holm Conference on, 65-71, 2016 | 7 | 2016 |
| The influence of multiscale surface roughness on contact mechanics using finite element modeling: Applied to a Au-coated CNT composite electrical contact surface H Liu, JW McBride Electrical Contacts, 2017 IEEE Holm Conference on, 229-235, 2017 | 6 | 2017 |
| An Asperity-Based Finite Element Model for Electrical Contact of Microswitches H Liu, D Leray, P Pons, S Colin 59th IEEE Holm Conference on Electrical Contacts (HOLM),, 2013 | 6 | 2013 |
| The wear of hot switching Au/Cr-Au/MWCNT contact pairs for MEMS contacts JW McBrice, H Liu, C Chianrabutra, AP Lewis IEICE Trans. Electron 9 (E98-C), 912-918, 2015 | 5 | 2015 |
| Finite element modeling of nickel oxide film for Au-Ni contact of MEMS switches H Liu, D Leray, Colin, S, P Pons 61st IEEE Holm Conference on Electrical Contacts (HOLM), 1-7, 2015 | 4 | 2015 |
| The development of a finite element contact model of a rough surface applied to a Au-coated carbon nanotube composite H Liu, JW McBride, MP Down, SH Pu 61st IEEE Holm Conference on Electrical Contacts (HOLM), 1-8, 2015 | 4 | 2015 |
| A finite element study of contact resistance for a flat bilayered Au/MWCNT surface H Liu, J Mcbride International Conference on Electric Contact. Edinburgh, 2016 | 3 | 2016 |
| Influence of the height of carbon nanotubes on hot switching of Au/Cr-Au/MWCNT contact pairs H Liu, AP Lewis, SH Pu, L Jiang, JW McBride 16th Electronics Packaging Technology Conference (EPTC2014), 1-5, 2014 | 2 | 2014 |
| Validation of Finite Element Structural Simulation for Ohmic Microcontact H Liu, D Leray, P Pons, S Colin, A Broué, J Martegoutte Procedia Engineering 25, 419-422, 2011 | 1 | 2011 |
| Electromechanical Investigation into the Influence of MWCNT Height on the Performance of Au/MWCNT Composites for Electrical Contacts AP Lewis, MP Down, H Liu, L Jiang, JW McBride 61st IEEE Holm Conference on Electrical Contacts (HOLM), 1-6, 2015 | | 2015 |
Adam P. LewisNational Physical LaboratoryVerified email at npl.co.uk
