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Samvel Shoukourian
Samvel Shoukourian
Scientific Leader, IT Educational and Research Center, Yerevan State University / Sr. Manager
Подтвержден адрес электронной почты в домене sci.am - Главная страница
Название
Процитировано
Процитировано
Год
Embedded-memory test and repair: infrastructure IP for SoC yield
Y Zorian, S Shoukourian
IEEE Design and Test of Computers, 58-66, 2003
3442003
SoC yield optimization via an embedded-memory test and repair infrastructure
S Shoukourian, V Vardanian, Y Zorian
IEEE Design & Test of Computers 21 (3), 200-207, 2004
942004
Experimental study on Hamming and Hsiao codes in the context of embedded applications
G Tshagharyan, G Harutyunyan, S Shoukourian, Y Zorian
2017 IEEE East-West Design & Test Symposium (EWDTS), 1-4, 2017
482017
An approach for evaluation of redundancy analysis algorithms
S Shoukourian, V Vardanian, Y Zorian
Proceedings 2001 IEEE International Workshop on Memory Technology, Design …, 2001
482001
A robust solution for embedded memory test and repair
K Darbinyan, G Harutyunyan, S Shoukourian, V Vardanian, Y Zorian
2011 Asian Test Symposium, 461-462, 2011
372011
A new method for march test algorithm generation and its application for fault detection in RAMs
G Harutyunyan, S Shoukourian, V Vardanian, Y Zorian
IEEE Transactions on computer-aided design of integrated circuits and …, 2012
332012
A methodology for design and evaluation of redundancy allocation algorithms
S Shoukourian, VA Vardanian, Y Zorian
22nd IEEE VLSI Test Symposium, 2004. Proceedings., 249-255, 2004
272004
Memory physical aware multi-level fault diagnosis flow
G Harutyunyan, S Martirosyan, S Shoukourian, Y Zorian
IEEE Transactions on Emerging Topics in Computing 8 (3), 700-711, 2018
212018
Various methods and apparatuses for memory modeling using a structural primitive verification for memory compilers
K Aleksanyan, K Amirkhanyan, S Karapetyan, A Shubat, S Shoukourian, ...
US Patent 8,112,730, 2012
202012
Symmetry measure for memory test and its application in BIST optimization
G Harutyunyan, A Hakhumyan, S Shoukourian, VA Vardanian, Y Zorian
Journal of Electronic Testing 27, 753-766, 2011
172011
Generic BIST architecture for testing of content addressable memories
H Grigoryan, G Harutyunyan, S Shoukourian, V Vardanian, Y Zorian
2011 IEEE 17th International On-Line Testing Symposium, 86-91, 2011
172011
Overview study on fault modeling and test methodology development for FinFET-based memories
G Tshagharyan, G Harutyunyan, S Shoukourian, Y Zorian
2015 IEEE East-West Design & Test Symposium (EWDTS), 1-4, 2015
162015
Fault awareness for memory BIST architecture shaped by multidimensional prediction mechanism
G Harutyunyan, S Shoukourian, Y Zorian
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018
152018
Test solutions for nanoscale Systems-on-Chip: Algorithms, methods and test infrastructure
Y Zorian, S Shoukourian
Ninth International Conference on Computer Science and Information …, 2013
152013
Testing electronic memories based on fault and test algorithm periodicity
A Hakhumyan, G Harutyunyan, S Shoukourian, V Vardanian, Y Zorian
US Patent App. 13/183,468, 2013
142013
An effective solution for building memory BIST infrastructure based on fault periodicity
G Harutyunyan, S Shoukourian, V Vardanian, Y Zorian
2013 IEEE 31st VLSI Test Symposium (VTS), 1-6, 2013
132013
The equivalence problem of multidimensional multitape automata
H Grigorian, S Shoukourian
Journal of Computer and System Sciences 74 (7), 1131-1138, 2008
132008
Memory modeling using an intermediate level structural description
K Aleksanyan, K Amirkhanyan, S Shoukourian, V Vardanian, Y Zorian
US Patent 7,768,840, 2010
122010
Extending fault periodicity table for testing faults in memories under 20nm
G Harutyunyan, S Shoukourian, V Vardanian, Y Zorian
Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014), 1-4, 2014
102014
The equivalence problem of deterministic multitape finite automata: a new proof of solvability using a multidimensional tape
AA Letichevsky, AS Shoukourian, SK Shoukourian
Language and Automata Theory and Applications: 4th International Conference …, 2010
102010
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