Authors
Xi Li, Weiming Hu, Zhongfei Zhang, Xiaoqin Zhang, Mingliang Zhu, Jian Cheng
Publication date
2008/6/23
Conference
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
Pages
1-8
Publisher
IEEE
Description
Recently, a novel Log-Euclidean Riemannian metric is proposed for statistics on symmetric positive definite (SPD) matrices. Under this metric, distances and Riemannian means take a much simpler form than the widely used affine-invariant Riemannian metric. Based on the Log-Euclidean Riemannian metric, we develop a tracking framework in this paper. In the framework, the covariance matrices of image features in the five modes are used to represent object appearance. Since a nonsingular covariance matrix is a SPD matrix lying on a connected Riemannian manifold, the Log-Euclidean Riemannian metric is used for statistics on the covariance matrices of image features. Further, we present an effective online Log-Euclidean Riemannian subspace learning algorithm which models the appearance changes of an object by incrementally learning a low-order Log-Euclidean eigenspace representation through …
Total citations
2008200920102011201220132014201520162017201820192020202120222023202426121521182116259945521
Scholar articles
X Li, W Hu, Z Zhang, X Zhang, M Zhu, J Cheng - 2008 IEEE Conference on Computer Vision and …, 2008