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Co-authors
- Xu XiaoProfessor, ESE, University of Electronic Science and Technology of ChinaVerified email at uestc.edu.cn
- Bin Hu (胡彬)Huazhong University of Science and TechnologyVerified email at hust.edu.cn
- Zhao WANG (王钊)Hubei University (湖北大学)Verified email at hubu.edu.cn
- Teng ZhaiNanjing University of Science and TechnologyVerified email at njust.edu.cn
- TIANPENG DINGResearch Fellow, National University of SingaporeVerified email at nus.edu.sg
- Xihong LuSun Yat-sen UniversityVerified email at mail.sysu.edu.cn
- Yuan GaoCETCVerified email at connect.ust.hk
- Huanyu Jin (金桓宇)Research Fellow, The University of AdelaideVerified email at adelaide.edu.au
- Kaifu HUOHuazhong University of Science and TechnologyVerified email at hust.edu.cn
- Peihua YangWuhan UniversityVerified email at whu.edu.cn
- Kang Liu (刘抗)Wuhan UniversityVerified email at whu.edu.cn
- Prof.Dr. Yuebin Li (李岳彬)湖北大学物理与电子科学学院Verified email at hubu.edu.cn
- Dmitri GolbergDistinguished Professor, Queensland University of Technology (QUT), Brisbane, AustraliaVerified email at qut.edu.au
- Yoshio BandoKing Saud University, University of WollongongVerified email at uow.edu.au
- Zhang Weihai香港城市大学Verified email at my.cityu.edu.hk
- Guozhen Shen/沈国震Institute of Semiconductors, Chinese Academy of SciencesVerified email at semi.ac.cn
- Zhong QizeNanyang Technological University; Huazhong University of Science and TechnologyVerified email at ntu.edu.sg
- haoshuang gu湖北大学物理学与电子科学学院
- YONGMING HUHubei University