| From anomalies to forecasts: Toward a descriptive model of decisions under risk, under ambiguity, and from experience. I Erev, E Ert, O Plonsky, D Cohen, O Cohen Psychological review 124 (4), 369, 2017 | 228 | 2017 |
| Vegetation establishment on the southern Israeli coastal sand dunes between the years 1965 and 1999 P Kutiel, O Cohen, M Shoshany, M Shub Landscape and urban planning 67 (1-4), 141-156, 2004 | 153 | 2004 |
| Encapsulated Pseudomonas putida for phenol biodegradation: Use of a structural membrane for construction of a well-organized confined particle E Kurzbaum, Y Raizner, O Cohen, RY Suckeveriene, A Kulikov, B Hakimi, ... Water Research 121, 37-45, 2017 | 68 | 2017 |
| Invasion rate of the alien species Acacia saligna within coastal sand dune habitats in Israel P Bar, O Cohen, M Shoshany Israel Journal of Plant Sciences 52 (2), 115-124, 2004 | 50 | 2004 |
| Reducing persistent seed banks of invasive plants by soil solarization—the case of Acacia saligna O Cohen, J Riov, J Katan, A Gamliel, P Bar Weed Science 56 (6), 860-865, 2008 | 47 | 2008 |
| CaJOINTLESS is a MADS-box gene involved in suppression of vegetative growth in all shoot meristems in pepper O Cohen, Y Borovsky, R David-Schwartz, I Paran Journal of experimental botany 63 (13), 4947-4957, 2012 | 39 | 2012 |
| Capsicum annuum S (CaS) promotes reproductive transition and is required for flower formation in pepper (Capsicum annuum) O Cohen, Y Borovsky, R David‐Schwartz, I Paran New phytologist 202 (3), 1014-1023, 2014 | 34 | 2014 |
| Community homogenization and the invasiveness of commensal species in Mediterranean afforested landscapes R Manor, O Cohen, D Saltz Biological Invasions 10, 507-515, 2008 | 33 | 2008 |
| The use of induced mutations to study shoot architecture in Capsicum I Paran, Y Borovsky, S Nahon, O Cohen Israel Journal of Plant Sciences 55 (2), 125-131, 2007 | 28 | 2007 |
| From anomalies to forecasts: A choice prediction competition for decisions under risk and ambiguity I Erev, E Ert, O Plonsky, D Cohen, O Cohen mimeo, 2015 | 21 | 2015 |
| Controlling the seed bank of the invasive plant Acacia saligna: comparison of the efficacy of prescribed burning, soil solarization, and their combination O Cohen, A Gamliel, J Katan, E Kurzbaum, J Riov, P Bar Biological invasions 20, 2875-2887, 2018 | 19 | 2018 |
| Lanthanum-modified bentonite: potential for efficient removal of phosphates from fishpond effluents E Kurzbaum, Y Raizner, O Cohen, G Rubinstein, O Bar Shalom Environmental Science and Pollution Research 24, 15182-15186, 2017 | 16 | 2017 |
| The impact of Acacia saligna invasion on the indigenous vegetation in various coastal habitats in Israel and its implication for nature conservation O Cohen, P Bar Israel Journal of Plant Sciences 64 (1-2), 111-121, 2017 | 14 | 2017 |
| Fertilization following pollination predominantly decreases phytocannabinoids accumulation and alters the accumulation of terpenoids in cannabis inflorescences C Lipson Feder, O Cohen, A Shapira, I Katzir, R Peer, O Guberman, ... Frontiers in Plant Science 12, 753847, 2021 | 13 | 2021 |
| Soil solarization: An environmentally-friendly alternative B Rubin, O Cohen, A Gamliel Technical Workshop on non-chemical alternatives to replace methyl bromide as …, 2007 | 13 | 2007 |
| Innovative scatterometry approach for self-aligned quadruple patterning (SAQP) process control A Gunay-Demirkol, EA Sanchez, S Heraud, S Godny, AL Charley, P Leray, ... Metrology, Inspection, and Process Control for Microlithography XXX 9778, 61-72, 2016 | 11 | 2016 |
| Advanced in-line optical metrology of sub-10nm structures for gate all around devices (GAA) R Muthinti, N Loubet, R Chao, J Ott, M Guillorn, N Felix, J Gaudiello, ... Metrology, Inspection, and Process Control for Microlithography XXX 9778 …, 2016 | 9 | 2016 |
| Rain‐based soil solarization for reducing the persistent seed banks of invasive plants in natural ecosystems – Acacia saligna as a model O Cohen, P Bar, A Gamliel, J Katan, E Kurzbaum, G Weber, I Schubert, ... Pest management science 75 (7), 1933-1941, 2019 | 7 | 2019 |
| CD metrology for EUV lithography and etch H Johanesen, A Kenslea, M Williamson, M Knowles, L Kwakman, ... 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2015 | 7 | 2015 |
| Scatterometry-based defect detection for DSA in-line process control R Chao, CC Liu, C Bozdog, A Cepler, M Sendelbach, O Cohen, ... Metrology, Inspection, and Process Control for Microlithography XXIX 9424 …, 2015 | 7 | 2015 |
