| A protocol test generation procedure K Sabnani, A Dahbura Computer Networks and ISDN systems 15 (4), 285-297, 1988 | 664 | 1988 |
| An optimization technique for protocol conformance test generation based on UIO sequences and rural Chinese postman tours AV Aho, AT Dahbura, D Lee, MU Uyar IEEE transactions on communications 39 (11), 1604-1615, 1991 | 632 | 1991 |
| The consensus problem in fault-tolerant computing M Barborak, A Dahbura, M Malek ACM Computing Surveys (CSur) 25 (2), 171-220, 1993 | 599 | 1993 |
| On self-diagnosable multiprocessor systems: diagnosis by the comparison approach A Sengupta, AT Dahbura IEEE Transactions on Computers 41 (11), 1386-1396, 1992 | 426 | 1992 |
| An 0 (n2. 5) fault identification algorithm for diagnosable systems AT Dahbura, GM Masson IEEE Transactions on Computers 33 (06), 486-492, 1984 | 426 | 1984 |
| Protocol conformance testing using multiple UIO sequences YN Shen, F Lombardi, AT Dahbura IEEE Transactions on Communications 40 (8), 1282-1287, 1992 | 178 | 1992 |
| The comparison approach to multiprocessor fault diagnosis AT Dahbura, KK Sabnani, LL King IEEE Transactions on Computers 36 (03), 373-378, 1987 | 149 | 1987 |
| Formal methods for generating protocol conformance test sequences AT Dahbura, KK Sabnani, MU Uyar Proceedings of the IEEE 78 (8), 1317-1326, 1990 | 133 | 1990 |
| A distributed system-level diagnosis algorithm for arbitrary network topologies S Rangarajan, AT Dahbura, EA Ziegler IEEE Transactions on Computers 44 (2), 312-334, 1995 | 118 | 1995 |
| Optimal test sequence generation for protocols: the Chinese postman algorithm applied to Q. 931 MÜ Uyar, AT Dahbura Conformance testing methodologies and architectures for OSI protocols, 347-351, 1995 | 103 | 1995 |
| MoCCA: A mobile communication and computing architecture A Smailagic, D Siewiorek, L Bass, B Iannucci, A Dahbura, S Eddleston, ... Digest of Papers. Third International Symposium on Wearable Computers, 64-71, 1999 | 100 | 1999 |
| Optimal test generation for finite state machine models AT Dahbura, KK Sabnani, MU Uyar US Patent 4,991,176, 1991 | 91 | 1991 |
| Increased throughput for the testing and repair of RAMs with redundancy RW Haddad, AT Dahbura, AB Sharma IEEE Transactions on Computers 40 (02), 154-166, 1991 | 88 | 1991 |
| A new technique for generating protocol test K Sabnani, A Dahbura ACM SIGCOMM Computer Communication Review 15 (4), 36-43, 1985 | 85 | 1985 |
| System-level diagnosis: A perspective for the third decade AT Dahbura Concurrent Computations, 411-434, 1988 | 81 | 1988 |
| An optimal test sequence for the JTAG/IEEE P1149. 1 test access port controller AT Dahbura, MU Uyar, CW Yau Proceedings.'Meeting the Tests of Time'., International Test Conference, 55-62, 1989 | 74 | 1989 |
| Yield enhancement of programmable ASIC arrays by reconfiguration of circuit placements J Narasimham, K Nakajima, CS Rim, AT Dahbura IEEE transactions on computer-aided design of integrated circuits and …, 1994 | 71 | 1994 |
| An experience in estimating fault coverage of a protocol test A Dahbura, K Sabnani IEEE INFOCOM'88, Seventh Annual Joint Conference of the IEEE Computer and …, 1988 | 56 | 1988 |
| Spare capacity as a means of fault detection and diagnosis in multiprocessor systems AT Dahbura, KK Sabnani, WJ Hery IEEE transactions on computers 38 (6), 881-891, 1989 | 50 | 1989 |
| A practical variation of the O (n 2.5) fault diagnosis algorithm AT Dahbura, GM Masson Proc. 1984 Symp. Fault Tolerant Comput., 428-433, 1984 | 41 | 1984 |
