| Temperature and switching rate dependence of crosstalk in Si-IGBT and SiC power modules S Jahdi, O Alatise, JAO Gonzalez, R Bonyadi, L Ran, P Mawby IEEE Transactions on Industrial Electronics 63 (2), 849-863, 2015 | 151 | 2015 |
| An analysis of the switching performance and robustness of power MOSFETs body diodes: A technology evaluation S Jahdi, O Alatise, R Bonyadi, P Alexakis, CA Fisher, JAO Gonzalez, ... IEEE Transactions on Power Electronics 30 (5), 2383-2394, 2014 | 109 | 2014 |
| Robustness and balancing of parallel-connected power devices: SiC versus CoolMOS J Hu, O Alatise, JAO Gonzalez, R Bonyadi, P Alexakis, L Ran, P Mawby IEEE Transactions on Industrial Electronics 63 (4), 2092-2102, 2015 | 86 | 2015 |
| The effect of electrothermal nonuniformities on parallel connected SiC power devices under unclamped and clamped inductive switching J Hu, O Alatise, JAO Gonzalez, R Bonyadi, L Ran, PA Mawby IEEE Transactions on Power Electronics 31 (6), 4526-4535, 2015 | 85 | 2015 |
| Compact electrothermal reliability modeling and experimental characterization of bipolar latchup in SiC and CoolMOS power MOSFETs R Bonyadi, O Alatise, S Jahdi, J Hu, JAO Gonzalez, L Ran, PA Mawby IEEE Transactions on Power Electronics 30 (12), 6978-6992, 2015 | 41 | 2015 |
| Investigating the reliability of SiC MOSFET body diodes using Fourier series modelling R Bonyadi, O Alatise, S Jahdi, J Hu, L Evans, PA Mawby 2014 IEEE Energy Conversion Congress and Exposition (ECCE), 443-448, 2014 | 22 | 2014 |
| Physics-based modelling and experimental characterisation of parasitic turn-on in IGBTs R Bonyadi, O Alatise, S Jahdi, J Ortiz-Gonzalez, Z Davletzhanova, L Ran, ... 2015 17th European Conference on Power Electronics and Applications (EPE'15 …, 2015 | 13 | 2015 |
| Comparative electrothermal analysis between SiC Schottky and silicon PiN diodes: Paralleling and thermal considerations J Hu, O Alatise, JAO Gonzalez, R Bonyadi, L Ran, P Mawby 2016 18th European Conference on Power Electronics and Applications (EPE'16 …, 2016 | 8 | 2016 |
| Electrothermal stresses in SiC MOSFET and Si IGBT 3L-NPC converters for motor drive applications Z Davletzhanova, O Alatise, JO Gonzalez, S Konaklieva, R Bonyadi PCIM Europe 2017; International Exhibition and Conference for Power …, 2017 | 5 | 2017 |
| Characterization of 4H-SiC PiN Diodes Formed on Defects Identified by PL Imaging Y Bonyadi, PM Gammon, R Bonyadi, VA Shah, CA Fisher, DM Martin, ... Materials Science Forum 858, 405-409, 2016 | 5 | 2016 |
| Compact electrothermal models for unbalanced parallel conducting Si-IGBTs R Bonyadi, O Alatise, J Hu, Z Davletzhanova, Y Bonyadi, J Ortiz-Gonzalez, ... 2016 IEEE Applied Power Electronics Conference and Exposition (APEC), 253-260, 2016 | 5 | 2016 |
| Impact of leakage currents on voltage sharing in series connected SiC power MOSFETs and silicon IGBT devices Z Davletzhanova, O Alatise, R Bonyadi, JO Gonzalez, CW Chan, ... 2018 20th European Conference on Power Electronics and Applications (EPE'18 …, 2018 | 3 | 2018 |
| Modeling of temperature dependent parasitic gate turn-on in silicon IGBTs R Bonyadi, O Alatise, S Jahdi, JO Gonzalez, L Ran, PA Mawby 2015 9th International Conference on Power Electronics and ECCE Asia (ICPE …, 2015 | 3 | 2015 |
| Safe-operating-area of snubberless series connected silicon and SiC power devices Z Davletzhanova, T Dai, O Alatise, JO Gonzalez, P Mawby, R Bonyadi, ... 2018 IEEE Energy Conversion Congress and Exposition (ECCE), 1875-1881, 2018 | 2 | 2018 |
| The impact of triangular defects on electrical characteristics and switching performance of 3.3 kV 4H-SiC PiN diode Y Bonyadi, P Gammon, R Bonyadi, O Alatise, J Hu, S Hindmarsh, ... 2016 IEEE Energy Conversion Congress and Exposition (ECCE), 1-5, 2016 | 2 | 2016 |
| Reliability assessment and modelling of power electronic devices for automotive application and design. R Bonyadi University of Warwick, 2016 | 2 | 2016 |
| Lifetime Enhancement of 4H-SiC PiN Diodes Using High Temperature Oxidation Treatment Y Bonyadi, PM Gammon, O Alatise, R Bonyadi, P Mawby Materials Science Forum 924, 440-443, 2018 | 1 | 2018 |
| Output harmonic analysis as a potential method of condition monitoring Z Davletzhanova, O Alatise, JAO Gonzalez, R Bonyadi, L Ran, P Mawby IET Digital Library, 2016 | 1 | 2016 |
| Characterization of Voltage Divergence in Series Connected SiC Trench MOSFETs and Si IGBTs Z Davletzhanova, O Alatise, R Bonyadi, JO Gonzalez, T Dai PCIM Europe 2018; International Exhibition and Conference for Power …, 2018 | | 2018 |
| A Technology Analysis of Voltage Sharing in Series Connected Power Devices Z Davletzhanova, O Alatise, R Bonyadi, J Ortiz-Gonzalez, T Dai, ... 2018 International Power Electronics Conference (IPEC-Niigata 2018-ECCE Asia …, 2018 | | 2018 |
Layi Alatise,PhD, CEng, FIET, SMIEEE, Professor of Power Electronics, University of WarwickVerified email at warwick.ac.uk
