Character of the insulating state in NiO: A mixture of charge-transfer and Mott-Hubbard character TM Schuler, DL Ederer, S Itza-Ortiz, GT Woods, TA Callcott, JC Woicik Physical Review B 71 (11), 115113, 2005 | 104 | 2005 |
Calculated half-metallic behavior in dilute magnetically doped ZnS RA Stern, TM Schuler, JM MacLaren, DL Ederer, V Perez-Dieste, ... Journal of applied physics 95 (11), 7468-7470, 2004 | 62 | 2004 |
Systematic trends of first-principles electronic structure computations of Zn 1− x A x B diluted magnetic semiconductors RD McNorton, TM Schuler, JM MacLaren, RA Stern Physical Review B 78 (7), 075209, 2008 | 61 | 2008 |
Prosthetic devices DB Thomas, N Maljkovic, MJ El-Hibri, T Schuler, TS Rushing, RL Carter US Patent 9,144,628, 2015 | 22 | 2015 |
Prosthetic devices DB Thomas, N Maljkovic, MJ El-Hibri, T Schuler, TS Rushing, RL Carter US Patent 9,144,628, 2015 | 22 | 2015 |
Prosthetic devices DB Thomas, N Maljkovic, MJ El-Hibri, T Schuler, TS Rushing, RL Carter US Patent 9,144,628, 2015 | 22 | 2015 |
Image-plate sensitivity to x rays at 2 to 60 keV MJ Rosenberg, DB Thorn, N Izumi, D Williams, M Rowland, G Torres, ... Review of Scientific Instruments 90 (1), 2019 | 18 | 2019 |
Electronic structure of the dilute magnetic semiconductor Zn 0.90 Mn 0.10 S obtained by soft x-ray spectroscopy and first-principles calculations TM Schuler, RA Stern, R McNorton, SD Willoughby, JM MacLaren, ... Physical Review B 72 (4), 045211, 2005 | 14 | 2005 |
Electronic structure of the dilute magnetic semiconductor Zn 0.90 Mn 0.10 S obtained by soft x-ray spectroscopy and first-principles calculations TM Schuler, RA Stern, R McNorton, SD Willoughby, JM MacLaren, ... Physical Review B 72 (4), 045211, 2005 | 14 | 2005 |
Chemical effects in the manganese x-ray emission that follows resonant and nonresonant photon production of a hole J Jiménez-Mier, DL Ederer, T Schuler Physical Review B 70 (3), 035216, 2004 | 14 | 2004 |
Polyarylene Composition and Articles Made Therefrom DB Thomas, N Maljkovic, T Schuler, TS Rushing, RL Carter US Patent App. 12/281,023, 2009 | 10 | 2009 |
X-ray Raman scattering at the manganese L edge of Mn F 2: Valence emission of Mn 2+ J Jiménez-Mier, DL Ederer, T Schuler Physical Review A 72 (5), 052502, 2005 | 9 | 2005 |
Direct evidence for 3p→ 2p non-dipole x-ray emission in transition metals J Jiménez-Mier, DL Ederer, T Schuler, TA Callcott Journal of Physics B: Atomic, Molecular and Optical Physics 36 (11), L173, 2003 | 8 | 2003 |
Ligand field and interference effects in L-edge x-ray Raman scattering of MnF2 and CoF2 J Jiménez-Mier, GM Herrera-Pérez, P Olalde-Velasco, DL Ederer, ... Revista mexicana de física 54, 30-35, 2008 | 7 | 2008 |
Correlation effects in the resonant and nonresonant manganese photon emission in J Jiménez-Mier, DL Ederer, T Schuler Physical Review A 68 (4), 042715, 2003 | 7 | 2003 |
Electronic structure of transition metal fluorides and oxides determined by resonant X-ray absorption and X-ray emission spectroscopies J Jiménez-Mier, GM Herrera-Pérez, P Olalde-Velasco, E Chavira, ... Radiation Effects & Defects in Solids 162 (7-8), 613-620, 2007 | 5 | 2007 |
X-ray Raman scattering at the L edge of manganese compounds: Characteristic behaviour of Mn2+ and Mn3+ J Jiménez-Mier, DL Ederer, T Schuler Radiation Physics and Chemistry 75 (11), 1666-1669, 2006 | 4 | 2006 |
Prosthetic devices DB Thomas, N Maljkovic, MJ El-Hibri, T Schuler, TS Rushing, RL Carter US Patent 8,592,531, 2013 | 3 | 2013 |
Diffusion of TiN into aluminum films measured by soft X-ray spectroscopy and Rutherford backscattering spectroscopy TM Schuler, DL Ederer, N Ruzycki, G Glass, WA Hollerman, A Moewes, ... Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (5 …, 2001 | 3 | 2001 |
Erratum:“Image-plate sensitivity to x rays at 2 to 60 keV”[Rev. Sci. Instrum. 90, 013506 (2019)] MJ Rosenberg, DB Thorn, N Izumi, D Williams, M Rowland, G Torres, ... Review of Scientific Instruments 90 (2), 2019 | 2 | 2019 |