| Impact of Noise Bandwidth on Noise Figure A Sheldon, L Belostotski, G Messier, A Madanayake IEEE Transactions on Instrumentation and Measurement 68 (7), 2662-2664, 2019 | 8 | 2019 |
| Cryogenic Noise-Parameter Measurements: Recent Research and a Fully Automated Measurement Application A Sheldon, L Belostotski, H Mani, CE Groppi, KF Warnick IEEE Microwave Magazine 22 (8), 52-64, 2021 | 7 | 2021 |
| A Cryo-CMOS Low-Noise Amplifier With 2.3-to-8.5-K Noise Temperature at 20 K for Highly Integrated Radio-Astronomy Receivers A Sheldon, L Belostotski IEEE Microwave and Wireless Components Letters 32 (11), 1319-1322, 2022 | 5 | 2022 |
| Delay-Tunable Compact RC-Only All-Pass Filter MB Elamien, A Sheldon, BJ Maundy, L Belostotski, AS Elwakil IEEE Microwave and Wireless Components Letters 31 (5), 461-464, 2021 | 4 | 2021 |
| Early results on energetic particle precipitation observed by the ABOVE instrument array CM Cully, D Chaddock, C Daniel, E Davis, D Galts, N McGuffin, C Quinn, ... AGU Fall Meeting Abstracts 2014, SA13B-3997, 2014 | 4 | 2014 |
| Automated noise-parameter measurements of cryogenic LNAs A Sheldon, L Belostotski, H Mani, CE Groppi, KF Warnick 2021 97th ARFTG Microwave Measurement Conference (ARFTG), 1-4, 2021 | 2 | 2021 |
| Cryo-CMOS Low-Noise Amplifier for the Square Kilometre Array A Sheldon, L Belostotski 2018 18th International Symposium on Antenna Technology and Applied …, 2018 | 2 | 2018 |
| Noise-Parameter Measurements of Very-Low-Noise Amplifiers at Ambient and Cryogenic Temperatures A Sheldon, L Belostotski IEEE Instrumentation & Measurement Magazine 24 (2), 79-83, 2021 | | 2021 |
| Dr. Ali Sheikholeslami's Circuit Intuitions Lecture at the University of Calgary [Chapters] A Sheldon, L Belostotski IEEE Solid-State Circuits Magazine 12 (2), 72-72, 2020 | | 2020 |
| Gamma Ray and Very Low Frequency Radio Observations from a Balloon-Borne Platform C Quinn, A Sheldon, CM Cully, A Davalos, C Osakwe, D Galts, J Delfin, ... AGU Fall Meeting Abstracts 2015, AE33A-0469, 2015 | | 2015 |
| Review of Cryogenic Noise-Parameter Measurements and an Application Example A Sheldon, L Belostotski, H Mani, CE Groppi, KF Warnick | | |
