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Kundan Nepal
Kundan Nepal
University of St. Thomas, Saint Paul, MN
Verified email at stthomas.edu
Title
Cited by
Cited by
Year
Designing logic circuits for probabilistic computation in the presence of noise
K Nepal, RI Bahar, J Mundy, WR Patterson, A Zaslavsky
Design Automation Conference, 2005. Proceedings. 42nd, 485-490, 2005
1132005
Apnea detection and respiration rate estimation through parametric modelling
K Nepal, E Biegeleisen, T Ning
Proceedings of the IEEE 28th annual northeast bioengineering conference …, 2002
742002
Design of a ternary static memory cell using carbon nanotube-based transistors
K You, K Nepal
Micro & Nano Letters, IET 6 (6), 381-385, 2011
512011
Using implications for online error detection
K Nepal, N Alves, J Dworak, RI Bahar
Test Conference, 2008. ITC 2008. IEEE International, 1-10, 2008
452008
A cost effective approach for online error detection using invariant relationships
N Alves, A Buben, K Nepal, J Dworak, RI Bahar
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions …, 2010
402010
Designing nanoscale logic circuits based on markov random fields
K Nepal, RI Bahar, J Mundy, WR Patterson, A Zaslavsky
Journal of Electronic Testing 23, 255-266, 2007
402007
Optimizing noise-immune nanoscale circuits using principles of Markov random fields
K Nepal, RI Bahar, J Mundy, WR Patterson, A Zaslavsky
Proceedings of the 16th ACM Great Lakes symposium on VLSI, 149-152, 2006
232006
Designing MRF based error correcting circuits for memory elements
K Nepal, RI Bahar, J Mundy, WR Patterson, A Zaslavsky
Design, Automation and Test in Europe, 2006. DATE'06. Proceedings 1, 1-2, 2006
232006
Noise margin-optimized ternary CMOS SRAM delay and sizing characteristics
Z Kamar, K Nepal
2010 53rd IEEE International Midwest Symposium on Circuits and Systems, 801-804, 2010
212010
Enhancing online error detection through area-efficient multi-site implications
N Alves, Y Shi, J Dworak, RI Bahar, K Nepal
VLSI Test Symposium (VTS), 2011 IEEE 29th, 241-246, 2011
202011
MRF reinforcer: A probabilistic element for space redundancy in nanoscale circuits
K Nepal, RI Bahar, J Muddy, WR Patterson, A Zaslavsky
Micro, IEEE 26 (5), 19-27, 2006
162006
Dynamic circuits for ternary computation in carbon nanotube based field effect transistors
K Nepal
NEWCAS Conference (NEWCAS), 2010 8th IEEE International, 53-56, 2010
152010
Carbon nanotube field effect transistor-based content addressable memory architectures
K Nepal, K You
IEE, 2012
142012
Techniques for designing noise-tolerant multi-level combinational circuits
K Nepal, RI Bahar, J Mundy, WR Patterson, A Zaslavsky
2007 Design, Automation & Test in Europe Conference & Exhibition, 1-6, 2007
132007
Stimulating curiosity and the ability to formulate technical questions in an electric circuits course using the question formulation technique (QFT)
HJ LeBlanc, K Nepal, GS Mowry
2017 IEEE Frontiers in Education Conference (FIE), 1-6, 2017
122017
Using Platform FPGAs for Fault Emulation and Test-set Generation to Detect Stuck-at Faults.
C Dunbar, K Nepal
J. Comput. 6 (11), 2335-2344, 2011
122011
Compacting test vector sets via strategic use of implications
N Alves, J Dworak, I Bahar, K Nepal
Computer-Aided Design-Digest of Technical Papers, 2009. ICCAD 2009. IEEE/ACM …, 2009
102009
Low-power FPGA routing switches using adaptive body biasing technique
GV Leming, K Nepal
2009 52nd IEEE International Midwest Symposium on Circuits and Systems, 447-450, 2009
102009
Combinational hardware Trojan detection using logic implications
N Cornell, K Nepal
2017 IEEE 60th International Midwest Symposium on Circuits and Systems …, 2017
92017
Detecting a trojan die in 3D stacked integrated circuits
S Alhelaly, J Dworak, T Manikas, P Gui, K Nepal, AL Crouch
2017 IEEE North Atlantic Test Workshop (NATW), 1-6, 2017
92017
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