Deepgate: Learning neural representations of logic gates M Li, S Khan, Z Shi, N Wang, H Yu, Q Xu Proceedings of the 59th ACM/IEEE Design Automation Conference, 667-672, 2022 | 15 | 2022 |
DeepTPI: Test Point Insertion with Deep Reinforcement Learning Z Shi, M Li, S Khan, L Wang, N Wang, Y Huang, Q Xu 2022 IEEE International Test Conference (ITC), 194-203, 2022 | 8 | 2022 |
Deepsat: An eda-driven learning framework for sat M Li, Z Shi, Q Lai, S Khan, S Cai, Q Xu arXiv preprint arXiv:2205.13745, 2022 | 6 | 2022 |
Deepgate2: Functionality-aware circuit representation learning Z Shi, H Pan, S Khan, M Li, Y Liu, J Huang, HL Zhen, M Yuan, Z Chu, ... 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD), 1-9, 2023 | 5 | 2023 |
SATformer: Transformers for SAT Solving Z Shi, M Li, S Khan, HL Zhen, M Yuan, Q Xu arXiv preprint arXiv:2209.00953, 2022 | 4 | 2022 |
On EDA-Driven Learning for SAT Solving M Li, Z Shi, Q Lai, S Khan, S Cai, Q Xu 2023 60th ACM/IEEE Design Automation Conference (DAC), 1-6, 2023 | 3 | 2023 |
DeepSeq: Deep Sequential Circuit Learning S Khan, Z Shi, M Li, Q Xu arXiv preprint arXiv:2302.13608, 2023 | 3 | 2023 |
Representation learning of logic circuits M Li, S Khan, Z Shi, N Wang, Y Huang, Q Xu 2022 59th ACM/IEEE Design Automation Conference (DAC), to appear, 2022 | 3 | 2022 |
SATformer: Transformer-Based UNSAT Core Learning Z Shi, M Li, Y Liu, S Khan, J Huang, HL Zhen, M Yuan, Q Xu 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD), 1-4, 2023 | 1 | 2023 |
Machine learning and its applications in test Y Huang, Q Xu, S Khan Machine Learning Support for Fault Diagnosis of System-on-Chip, 59-98, 2023 | 1 | 2023 |
EDA-Driven Preprocessing for SAT Solving Z Shi, T Tang, S Khan, HL Zhen, M Yuan, Z Chu, Q Xu arXiv preprint arXiv:2403.19446, 2024 | | 2024 |
The Dawn of AI-Native EDA: Promises and Challenges of Large Circuit Models L Chen, Y Chen, Z Chu, W Fang, TY Ho, Y Huang, S Khan, M Li, X Li, ... arXiv preprint arXiv:2403.07257, 2024 | | 2024 |