Development of a novel wet cleaning solution for Post-CMP SiO2 and Si3N4 films J Song, K Park, S Jeon, J Lee, T Kim Materials Science in Semiconductor Processing 140, 106353, 2022 | 11 | 2022 |
Investigation of abrasive behavior between pad asperity and oxide thin film in chemical mechanical planarization S Jeon, J Lee, S Hong, H Seo, Y Cho, P Liu, K Park, T Kim Materials Science in Semiconductor Processing 138, 106280, 2022 | 8 | 2022 |
The mechanical effect of soft pad on copper chemical mechanical polishing P Liu, Y Nam, S Lee, E Kim, S Jeon, K Park, S Hong, T Kim Materials Science in Semiconductor Processing 155, 107256, 2023 | 6 | 2023 |
Chemically-induced active micro-nano bubbles assisting chemical mechanical polishing: Modeling and experiments L Xu, K Park, H Lei, P Liu, E Kim, Y Cho, T Kim, C Chen Friction 11 (9), 1624-1640, 2023 | 5 | 2023 |
Quadrature moment simulation of silica nanoparticles aggregation and breakage in chemical mechanical polishing S Choi, G Im, E Kim, K Park, T Kim Journal of Industrial and Engineering Chemistry 107, 207-214, 2022 | 3 | 2022 |