| Improving stamps for 10 nm level wafer scale nanoimprint lithography M Beck, M Graczyk, I Maximov, EL Sarwe, TGI Ling, M Keil, L Montelius Microelectronic Engineering 61, 441-448, 2002 | 373 | 2002 |
| Sulfur passivation for ohmic contact formation to InAs nanowires DB Suyatin, C Thelander, MT Björk, I Maximov, L Samuelson Nanotechnology 18 (10), 105307, 2007 | 241 | 2007 |
| Nanoimprint lithography at the 6 in. wafer scale B Heidari, I Maximov, L Montelius Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000 | 164 | 2000 |
| Nonlinear operation of GaInAs/InP-based three-terminal ballistic junctions I Shorubalko, HQ Xu, I Maximov, P Omling, L Samuelson, W Seifert Applied Physics Letters 79 (9), 1384-1386, 2001 | 162 | 2001 |
| Assembling strained InAs islands on patterned GaAs substrates with chemical beam epitaxy S Jeppesen, MS Miller, D Hessman, B Kowalski, I Maximov, L Samuelson Applied physics letters 68 (16), 2228-2230, 1996 | 134 | 1996 |
| Large scale nanolithography using nanoimprint lithography B Heidari, I Maximov, EL Sarwe, L Montelius Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999 | 123 | 1999 |
| Microwave detection at 110 GHz by nanowires with broken symmetry C Balocco, AM Song, M Åberg, A Forchel, T González, J Mateos, ... Nano Letters 5 (7), 1423-1427, 2005 | 121 | 2005 |
| Nanoimprint-and UV-lithography: mix&match process for fabrication of interdigitated nanobiosensors L Montelius, B Heidari, M Graczyk, I Maximov, EL Sarwe, TGI Ling Microelectronic engineering 53 (1-4), 521-524, 2000 | 89 | 2000 |
| The c-axis thermal conductivity of graphite film of nanometer thickness measured by time resolved X-ray diffraction M Harb, C von Korff Schmising, H Enquist, A Jurgilaitis, I Maximov, ... Applied Physics Letters 101 (23), 2012 | 86 | 2012 |
| A novel frequency-multiplication device based on three-terminal ballistic junction I Shorubalko, HQ Xu, I Maximov, D Nilsson, R Omling, L Samuelson, ... IEEE Electron Device Letters 23 (7), 377-379, 2002 | 75 | 2002 |
| Quantized conductance in a heterostructurally defined quantum wire P Ramvall, N Carlsson, I Maximov, P Omling, L Samuelson, W Seifert, ... Applied physics letters 71 (7), 918-920, 1997 | 75 | 1997 |
| Fabrication of Si-based nanoimprint stamps with sub-20 nm features I Maximov, EL Sarwe, M Beck, K Deppert, M Graczyk, MH Magnusson, ... Microelectronic Engineering 61, 449-454, 2002 | 74 | 2002 |
| Strong Schottky barrier reduction at Au-catalyst/GaAs-nanowire interfaces by electric dipole formation and Fermi-level unpinning DB Suyatin, V Jain, VA Nebol’sin, J Trägårdh, ME Messing, JB Wagner, ... Nature Communications 5 (1), 3221, 2014 | 72 | 2014 |
| Lift-off process for nanoimprint lithography P Carlberg, M Graczyk, EL Sarwe, I Maximov, M Beck, L Montelius Microelectronic engineering 67, 203-207, 2003 | 71 | 2003 |
| Strategies to obtain pattern fidelity in nanowire growth from large-area surfaces patterned using nanoimprint lithography G Otnes, M Heurlin, M Graczyk, J Wallentin, D Jacobsson, A Berg, ... Nano Research 9, 2852-2861, 2016 | 70 | 2016 |
| Polymer stamps for nanoimprinting K Pfeiffer, M Fink, G Ahrens, G Gruetzner, F Reuther, J Seekamp, ... Microelectronic Engineering 61, 393-398, 2002 | 68 | 2002 |
| Electrical properties of self-assembled branched InAs nanowire junctions DB Suyatin, J Sun, A Fuhrer, D Wallin, LE Fröberg, LS Karlsson, ... Nano letters 8 (4), 1100-1104, 2008 | 66 | 2008 |
| Novel nanoelectronic triodes and logic devices with TBJs HQ Xu, I Shorubalko, D Wallin, I Maximov, P Omling, L Samuelson, ... IEEE Electron Device Letters 25 (4), 164-166, 2004 | 62 | 2004 |
| Lithography of high spatial density biosensor structures with sub-100 nm spacing by MeV proton beam writing with minimal proximity effect HJ Whitlow, ML Ng, V Auželyté, I Maximov, L Montelius, JA van Kan, ... Nanotechnology 15 (1), 223, 2003 | 58 | 2003 |
| Nanometer-scale two-terminal semiconductor memory operating at room temperature AM Song, M Missous, P Omling, I Maximov, W Seifert, L Samuelson Applied Physics Letters 86 (4), 2005 | 50 | 2005 |
