Area efficient and fast combined binary/decimal floating point fused multiply add unit AA Wahba, HAH Fahmy IEEE Transactions on Computers 66 (2), 226-239, 2016 | 28 | 2016 |
Wafer pattern recognition using tucker decomposition A Wahba, LC Wang, Z Zhang, N Sumikawa 2019 IEEE 37th VLSI Test Symposium (VTS), 1-6, 2019 | 11 | 2019 |
Deploying a machine learning solution as a surrogate C Shan, A Wahba, LC Wang, N Sumikawa 2019 IEEE International Test Conference (ITC), 1-10, 2019 | 8 | 2019 |
Wafer plot classification using neural networks and tensor methods A Wahba, C Shan, LC Wang, N Sumikawa 2019 IEEE International Test Conference in Asia (ITC-Asia), 79-84, 2019 | 8 | 2019 |
Measuring the complexity of learning in concept recognition A Wahba, C Shan, LC Wang, S Nik 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), 1-4, 2019 | 6 | 2019 |
Expediting Design Bug Discovery in Regressions of x86 Processors Using Machine Learning A Wahba, J Hohnerlein, F Rahman 2019 20th International Workshop on Microprocessor/SoC Test, Security and …, 2019 | 3 | 2019 |
Primitive concept identification in a given set of wafer maps A Wahba, CJ Shan, LC Wang, N Sumikawa 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), 1-4, 2019 | 1 | 2019 |
Dynamic exerciser template weighting in x86 processor verification A Wahba, J Hohnerlein, F Rahman, LC Wang 2017 18th International Workshop on Microprocessor and SOC Test and …, 2017 | 1 | 2017 |
Facilitating Deployment Of A Wafer-Based Analytic Software Using Tensor Methods LC Wang, CJ Shan, A Wahba 2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-8, 2019 | | 2019 |
Tensor Decomposition for Concept Recognition A Wahba University of California, Santa Barbara, 2019 | | 2019 |
IEEE-COMPLIANT BINARY/DECIMAL UNIT BASED ON A BINARY/DECIMAL FMA AAA Wahba Faculty of Engineering at Cairo University in Partial Fulfillment of the …, 2014 | | 2014 |