Padre: Physically-aware diagnostic resolution enhancement Y Xue, O Poku, X Li, RD Blanton 2013 IEEE International Test Conference (ITC), 1-10, 2013 | 45 | 2013 |
DREAMS: DFM rule EvAluation using manufactured silicon RD Blanton, F Wang, C Xue, PK Nag, Y Xue, X Li 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 99-106, 2013 | 26 | 2013 |
Improving diagnostic resolution of failing ICs through learning Y Xue, X Li, RD Blanton IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016 | 25 | 2016 |
Diagnostic resolution improvement through learning-guided physical failure analysis C Lim, Y Xue, X Li, RD Blanton, ME Amyeen 2016 IEEE International Test Conference (ITC), 1-10, 2016 | 20 | 2016 |
DFM evaluation using IC diagnosis data RDS Blanton, F Wang, C Xue, PK Nag, Y Xue, X Li IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016 | 12 | 2016 |
Correlation of very fast transmission line pulse (VFTLP) and field-induced charged device model (CDM) testing Y Xue 2012 19th IEEE International Symposium on the Physical and Failure Analysis …, 2012 | 6 | 2012 |
Physically-aware diagnostic resolution enhancement for digital circuits Y Xue Carnegie Mellon University, 2016 | 1 | 2016 |