Benefits of energetic ion bombardment for tailoring stress and microstructural evolution during growth of Cu thin films F Cemin, G Abadias, T Minea, C Furgeaud, F Brisset, D Solas, D Lundin Acta Materialia 141, 120-130, 2017 | 58 | 2017 |
Epitaxial growth of Cu (001) thin films onto Si (001) using a single-step HiPIMS process F Cemin, D Lundin, C Furgeaud, A Michel, G Amiard, T Minea, G Abadias Scientific reports 7 (1), 1655, 2017 | 45 | 2017 |
In situ and real-time nanoscale monitoring of ultra-thin metal film growth using optical and electrical diagnostic tools J Colin, A Jamnig, C Furgeaud, A Michel, N Pliatsikas, K Sarakinos, ... Nanomaterials 10 (11), 2225, 2020 | 24 | 2020 |
Formation mechanisms of Ti2AlC MAX phase on SiC-4H using magnetron sputtering and post-annealing J Nicolaï, C Furgeaud, BW Fonrose, C Bail, MF Beaufort Materials & Design 144, 209-213, 2018 | 21 | 2018 |
Uniform tensile elongation in Au–Si core–shell nanowires J Godet, C Furgeaud, L Pizzagalli, MJ Demkowicz Extreme Mechanics Letters 8, 151-159, 2016 | 14 | 2016 |
Impact of Ge alloying on the early growth stages, microstructure and stress evolution of sputter-deposited Cu-Ge thin films C Furgeaud, L Simonot, A Michel, C Mastail, G Abadias Acta Materialia 159, 286-295, 2018 | 13 | 2018 |
Multi-scale study of Ti3SiC2 thin film growth mechanisms obtained by magnetron sputtering C Furgeaud, F Brenet, J Nicolai Materialia 7, 100369, 2019 | 8 | 2019 |
Interfacial Silicide Formation and Stress Evolution during Sputter Deposition of Ultrathin Pd Layers on a-Si B Krause, G Abadias, C Furgeaud, A Michel, A Resta, A Coati, Y Garreau, ... ACS Applied Materials & Interfaces 11 (42), 39315-39323, 2019 | 7 | 2019 |
Effets cinétique et chimique lors des premiers stades de croissance de films minces métalliques: compréhension multi-échelle par une approche expérimentale et modélisation … C Furgeaud Université de Poitiers, 2019 | 2 | 2019 |
Strain generated by the stacking faults in epitaxial SrO (SrTiO3) N Ruddlesden–Popper structures G Saint-Girons, C Furgeaud, L Largeau, A Danescu, R Bachelet, ... Journal of Applied Crystallography 56 (5), 2023 | | 2023 |
La diffraction des photoélectrons X (XPD) comme sonde locale dans des hétérostructures épitaxiées C Botella, R Bachelet, J Penuelas, C Furgeaud, I Dudko, D Han, R Moalla, ... JNSPE2023, 2023 | | 2023 |