Centralized inverse-Fano distribution for controlling conversion gain measurement accuracy of detector elements AJ Hendrickson JOSA A 34 (8), 1411-1423, 2017 | 9 | 2017 |
Photon counting histogram expectation maximization algorithm for characterization of deep sub-electron read noise sensors A Hendrickson, DP Haefner IEEE Journal of the Electron Devices Society, 2023 | 4 | 2023 |
On the optimal measurement of conversion gain in the presence of dark noise A Hendrickson, DP Haefner, BL Preece JOSA A 39 (12), 2169-2185, 2022 | 4 | 2022 |
The inverse gamma-difference distribution and its first moment in the Cauchy principal value sense A Hendrickson Statistics and Its Interface 12 (3), 467-478, 2019 | 4 | 2019 |
Experimental verification of PCH-EM algorithm for characterizing dsern image sensors A Hendrickson, DP Haefner, NR Shade, ER Fossum IEEE Journal of the Electron Devices Society, 2023 | 3 | 2023 |
A comparative study of methods to estimate conversion gain in sub-electron and multi-electron read noise regimes A Hendrickson, DP Haefner Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXIV …, 2023 | 3 | 2023 |
A novel approach to photon transfer conversion gain estimation A Hendrickson arXiv preprint arXiv:2106.14958, 2021 | 1 | 2021 |
PCH-EM: A solution to information loss in the photon transfer method AJ Hendrickson, DP Haefner, SH Chan, NR Shade, ER Fossum arXiv preprint arXiv:2403.04498, 2024 | | 2024 |
Photon Counting Accuracy in Digital Image Sensors AJ Hendrickson arXiv preprint arXiv:2311.14839, 2023 | | 2023 |
Centralized inverse-Fano distribution for controlling conversion gain measurement accuracy of detector elements: erratum AJ Hendrickson JOSA A 39 (3), 440-440, 2022 | | 2022 |
Exact and approximate solutions to the minimum of A Hendrickson, CF Leibovici arXiv preprint arXiv:2105.00135, 2021 | | 2021 |
Focal plane illuminator for generalized photon transfer characterization of image sensor A Hendrickson, G Lohman US Patent 10,645,378, 2020 | | 2020 |