| Intelligent fault analysis decision flow in semiconductor industry 4.0 using natural language processing with deep clustering K Ezukwoke, H Toubakh, A Hoayek, M Batton-Hubert, X Boucher, ... 2021 IEEE 17th international conference on automation science and …, 2021 | 11 | 2021 |
| Logistic Regression and Kernel Logistic Regression—A Comparative Study of Logistic Regression and Kernel Logistic Regression for Binary Classification KI Ezukwoke, SJ Zareian University Jean Monnet: Saint-Etienne, France, 2019 | 7 | 2019 |
| Kernel methods for principal component analysis (PCA) A comparative study of classical and kernel PCA K Ezukwoke, SJ Zareian A preprint, 2019 | 7 | 2019 |
| GCVAE: Generalized-controllable variational autoencoder K Ezukwoke, A Hoayek, M Batton-Hubert, X Boucher arXiv preprint arXiv:2206.04225, 2022 | 5 | 2022 |
| NLP based on GCVAE for intelligent Fault Analysis in Semiconductor industry Z Wang, K Ezukwoke, A Hoayek, M Batton-Hubert, X Boucher 2022 IEEE 27th international conference on emerging technologies and factory …, 2022 | 3 | 2022 |
| Unsupervised approach for an optimal representation of the latent space of a failure analysis dataset A Rammal, K Ezukwoke, A Hoayek, M Batton-Hubert The Journal of Supercomputing 80 (5), 5923-5949, 2024 | 2 | 2024 |
| Root cause prediction for failures in semiconductor industry, a genetic algorithm–machine learning approach A Rammal, K Ezukwoke, A Hoayek, M Batton-Hubert Scientific Reports 13 (1), 4934, 2023 | 2 | 2023 |
| Online Learning and Active Learning: A Comparative Study of Passive-Aggressive Algorithm With Support Vector Machine (SVM). KI Ezukwoke, SJ Zareian Journal of Higher Education Theory & Practice 21 (3), 2021 | 2 | 2021 |
| Data Transformation for Machine Learning K Ezukwoke, UJ Monnet URL https://www. academia. edu/40436475 …, 0 | 2 | |
| Leveraging Pre-trained Models for Failure Analysis Triplets Generation K Ezukwoke, A Hoayek, M Batton-Hubert, X Boucher, P Gounet, J Adrian arXiv preprint arXiv:2210.17497, 2022 | 1 | 2022 |
| Big GCVAE: decision-making with adaptive transformer model for failure root cause analysis in semiconductor industry K Ezukwoke, A Hoayek, M Batton-Hubert, X Boucher, P Gounet, J Adrian Journal of Intelligent Manufacturing, 2024 | | 2024 |
| Correction: Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry Z Wang, K Ezukwoke, A Hoayek, M Batton-Hubert, X Boucher Journal of Intelligent Manufacturing, 1-1, 2023 | | 2023 |
| Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry Z Wang, K Ezukwoke, A Hoayek, M Batton-Hubert, X Boucher Journal of Intelligent Manufacturing, 1-16, 2023 | | 2023 |
| Sensitivity Analysis of Text Vectorization Techniques for Failure Analysis: A Latent Dirichlet Allocation and Generalized Variational Autoencoder Approach A Rammal, K Ezukwoke, A Hoayek, MB Hubert | | 2023 |
| Unsupervised Variable Selection Using a Genetic Algorithm: An Application to Textual Data A Rammal, K Ezukwoke, A Hoayek, M Batton-Hubert 2022 International Conference on Smart Systems and Power Management (IC2SPM …, 2022 | | 2022 |
| β-Variational AutoEncoder and Gaussian Mixture Model for Fault Analysis Decision Flow in Semiconductor Industry 4.0 K Ezukwoke, A Hoayek, M Batton-Hubert, X Boucher, P Gounet ENBIS 2021 Spring Meeting, 2021 | | 2021 |
| Online Learning and Active Learning KI Ezukwoke, SJ Zareian | | |
| Support Vector Data Description (SVDD) An experimental study for Anomaly detection KI Ezukwoke, SJ Zareian | | |
Mireille Batton-HubertEcole des Mines de Saint-EtienneVerified email at emse.fr
