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Antonio José Gines
Antonio José Gines
IMSE
Verified email at imse-cnm.csic.es
Title
Cited by
Cited by
Year
Background Digital Calibration of Comparator Offsets in Pipeline ADCs
AJ Ginés, E Peralías, A Rueda
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (7 …, 2015
262015
A mixed-signal design reuse methodology based on parametric behavioural models with non-ideal effects
AJ Ginés, E Peralías, A Rueda, NM Madrid, R Seepold
Design, Automation and Test in Europe Conference and Exhibition, 2002 …, 2002
262002
Blind adaptive estimation of integral nonlinear errors in ADCs using arbitrary input stimulus
AJ Gines Arteaga, EJ Peralías, A Rueda
Instrumentation and Measurement, IEEE Transactions on 60 (2), 452-461, 2011
232011
Black-Box Calibration for ADCs With Hard Nonlinear Errors Using a Novel INL-Based Additive Code: A Pipeline ADC Case Study
AJ Ginés, EJ Peralías, A Rueda
IEEE Transactions on Circuits and Systems I: Regular Papers, 2017
212017
Design trade-offs for on-chip driving of high-speed high-performance ADCs in static BIST applications
AJ Gines, E Peralias, G Leger, A Rueda, G Renaud, MJ Barragan, S Mir
2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW), 1-6, 2016
212016
A compact R-2R DAC for BIST applications
A Rabal, A Otin, I Urriza, AJ Gines, G Leger, A Rueda
2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW), 1-6, 2016
21*2016
On Chopper Effects in Discrete-Time< formula formulatype=
G Léger, AJ Gines Arteaga, EJ Peralías Macías, A Rueda
Circuits and Systems I: Regular Papers, IEEE Transactions on 57 (9), 2438-2449, 2010
20*2010
Assessing AMS-RF test quality by defect simulation.
V Gutierrez, A Gines, G Leger
IEEE Transactions on Device and Materials Reliability, 2019
182019
INL systematic reduced-test technique for Pipeline ADCs
E Peralias, A Gines, A Rueda
Test Symposium (ETS), 2014 19th IEEE European, 1-6, 2014
172014
Linearity test of high-speed high-performance ADCs using a self-testable on-chip generator
AJ Gines, E Peralias, G Leger, A Rueda, G Renaud, MJ Barragan, S Mir
2016 21th IEEE European Test Symposium (ETS), 1-6, 2016
132016
A 1.2 V 5.14 mW quadrature frequency synthesizer in 90nm CMOS technology for 2.4 GHz ZigBee applications
AJ Gines, R Doldán, A Villegas, AJ Acosta, MA Jalón, D Vázquez, ...
Institute of Electrical and Electronics Engineers, 2008
132008
Digital background calibration technique for pipeline ADCs with multi-bit stages
AJ Ginés, EJ Peralías, A Rueda
Integrated Circuits and Systems Design, 2003. SBCCI 2003. Proceedings. 16th …, 2003
132003
Likelihood-sampling adaptive fault simulation
G Leger, A Gines
Mixed Signals Testing Workshop (IMSTW), 2017 International, 1-6, 2017
122017
A survey on digital background calibration of ADCs
AJ Ginés, EJ Peralías, A Rueda
Circuit Theory and Design, 2009. ECCTD 2009. European Conference on, 101-104, 2009
122009
A 76nW, 4kS/s 10-bit SAR ADC with offset cancellation for biomedical applications
M Delgado-Restituto, M Carrasco-Robles, R Fiorelli, AJ Ginés-Arteaga, ...
2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS), 421-424, 2016
112016
Low-jitter differential clock driver circuits for high-performance high-resolution ADCs
J Nunez, AJ Gines, EJ Peralias, A Rueda
Design of Circuits and Integrated Systems (DCIS), 2015 Conference on, 1-4, 2015
112015
Description of SAR ADCs with Digital Redundancy using a Unified Hardware-Based Approach
A Gines, A Lopez-Angulo, E Peralias, A Rueda
Circuits and Systems (ISCAS), 2018 IEEE International Symposium on, 1-5, 2018
82018
On the limits of machine learning-based test: A calibrated mixed-signal system case study
MJ Barragan, G Leger, A Gines, E Peralias, A Rueda
2017 Design, Automation & Test in Europe Conference & Exhibition (DATE), 79-84, 2017
72017
Sigma-delta testability for pipeline A/D converters
A Gines, G Leger
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014 …, 2014
72014
Improved background algorithms for Pipeline ADC full calibration
AJ Ginés, EJ Peralias, A Rueda
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on …, 2007
72007
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