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Ravikiran Attota
Ravikiran Attota
Other namesA. Ravikiran / Ravi Kiran Attota
Deputy Dir., Nanotechnology Core Facility, FDA/NCTR
Verified email at fda.hhs.gov
Title
Cited by
Cited by
Year
Effect of sliding speed on wear behaviour of A356 Al-30 wt.% SiCp MMC
A Ravikiran, MK Surappa
wear 206 (1-2), 33-38, 1997
1131997
Fundamental limits of optical critical dimension metrology: a simulation study
R Silver, T Germer, R Attota, BM Barnes, B Bunday, J Allgair, E Marx, ...
Metrology, Inspection, and Process Control for Microlithography XXI 6518 …, 2007
1042007
Effect of contact pressure and load on wear of alumina
A Ravikiran, S Jahanmir
Wear 251 (1-12), 980-984, 2001
902001
Scatterfield microscopy for extending the limits of image-based optical metrology
RM Silver, BM Barnes, R Attota, J Jun, M Stocker, E Marx, HJ Patrick
Applied optics 46 (20), 4248-4257, 2007
872007
Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysis
R Attota, TA Germer, RM Silver
Optics Letters 33 (17), 1990-1992, 2008
772008
Effect of speed and pressure on dry sliding interactions of alumina against steel
A Ravikiran, VS Nagarajan, SK Biswas, BNP Bai
Journal of the American Ceramic Society 78 (2), 356-364, 1995
681995
Nanometrology using a through-focus scanning optical microscopy method
R Attota, R Silver
Measurement Science and Technology 22 (2), 024002, 2010
512010
TSOM method for semiconductor metrology
R Attota, RG Dixson, JA Kramar, JE Potzick, AE Vladár, B Bunday, ...
Metrology, Inspection, and Process Control for Microlithography XXV 7971 …, 2011
472011
Application of through-focus focus-metric analysis in high resolution optical metrology
R Attota, R Silver, T Germer, M Bishop, R Larrabee, M Stocker, L Howard
Microlithography 2005 5752, 1441-1449, 2005
46*2005
Critical dimension metrology by through-focus scanning optical microscopy beyond the 22 nm node
R Attota, B Bunday, V Vartanian
Applied Physics Letters 102 (22), 2013
382013
Effect of interface layers formed during dry sliding of zirconia toughened alumina (ZTA) and monolithic alumina against steel
A Ravikiran, GR Subbanna, BNP Bai
Wear 192 (1-2), 56-65, 1996
381996
Wear quantification
A Ravikiran
J. Trib. 122 (3), 650-656, 2000
372000
Oscillations in coefficient of friction during dry sliding of A356 Al-30% wt SiC {sub p} MMC against steel
A Ravikiran, MK Surappa
Scripta materialia 36 (1), 1997
371997
Nanoparticle size determination using optical microscopes
R Attota, PP Kavuri, H Kang, R Kasica, L Chen
Applied Physics Letters 105 (16), 163105, 2014
352014
Resolving three-dimensional shape of sub-50 nm wide lines with nanometer-scale sensitivity using conventional optical microscopes
R Attota, R Dixson
Applied Physics Letters 105, 043101, 2014
352014
Optical through-focus technique that differentiates small changes in line width, line height, and sidewall angle for CD, overlay, and defect metrology applications
R Attota, R Silver, BM Barnes
Metrology, Inspection, and Process Control for Microlithography XXII 6922 …, 2008
332008
Angle resolved optical metrology
RM Silver, BM Barnes, A Heckert, R Attota, R Dixson, J Jun
Metrology, Inspection, and Process Control for Microlithography XXII 6922 …, 2008
332008
Influence of speed on the tribochemical reaction products and the associated transitions for the dry sliding of silicon nitride against steel
A Ravikiran, BNP Bai
Journal of the American Ceramic Society 78 (11), 3025-3032, 1995
321995
High-resolution optical metrology
RM Silver, R Attota, M Stocker, M Bishop, L Howard, T Germer, E Marx, ...
Metrology, Inspection, and Process Control for Microlithography XIX 5752, 67-79, 2005
312005
High-resolution optical overlay metrology
RM Silver, R Attota, M Stocker, M Bishop, JSJ Jun, E Marx, MP Davidson, ...
Metrology, Inspection, and Process Control for Microlithography XVIII 5375 …, 2004
302004
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