| Charged-particle microscope providing depth-resolved imagery F Boughorbel, P Potocek, CS Kooijman, BH Lich US Patent 8,586,921, 2013 | 30 | 2013 |
| How should a fixed budget of dwell time be spent in scanning electron microscopy to optimize image quality? P Trampert, F Bourghorbel, P Potocek, M Peemen, C Schlinkmann, ... Ultramicroscopy 191, 11-17, 2018 | 29 | 2018 |
| Charged particle microscope providing depth-resolved imagery F Boughorbel, EGT Bosch, P Potocek, X Zhuge, BH Lich US Patent 8,704,176, 2014 | 20 | 2014 |
| Mathematical image assembly in a scanning-type microscope P Poto, CS Kooijman, HN Slingerland, GNA van Veen, F Boughorbel US Patent 9,620,330, 2017 | 18 | 2017 |
| Computational scanning microscopy with improved resolution P Potocek, F Boughorbel, BH Lich, M Langhorst US Patent 9,478,393, 2016 | 16 | 2016 |
| Charged particle microscope with special aperture plate P Potocek, FMHM Van Laarhoven, F Boughorbel, R Schoenmakers, ... US Patent 9,934,936, 2018 | 14 | 2018 |
| Bringing deconvolution algorithmic techniques to the electron microscope B Lich, X Zhuge, P Potocek, F Boughorbel, C Mathisen Biophysical Journal 104 (2), 500a, 2013 | 11 | 2013 |
| SEM 3D Reconstruction of Stained Bulk Bio Samples using Landing Energy Variation and Deconvolution F Boughorbel, X Zhuge, P Potocek, B Lich Microsc Microanal 18, 560-561, 2012 | 10 | 2012 |
| A probe method for determination of time evolution of metastable atoms density in a flowing afterglow plasma J Pavlik, J Glosik, M Šícha, M Tichý, P Potoček Contributions to Plasma Physics 30 (3), 437-448, 1990 | 9 | 1990 |
| Adaptive specimen image acquisition using an artificial neural network P Potocek US Patent 10,928,335, 2021 | 8 | 2021 |
| Sparse scanning electron microscopy data acquisition and deep neural networks for automated segmentation in connectomics P Potocek, P Trampert, M Peemen, R Schoenmakers, T Dahmen Microscopy and Microanalysis 26 (3), 403-412, 2020 | 8 | 2020 |
| High-throughput large volume SEM workflow using sparse scanning and in-painting algorithms inspired by compressive sensing F Boughorbel, P Potocek, M Hovorka, L Strakos, J Mitchels, T Vystavel, ... Microscopy and Microanalysis 23 (S1), 150-151, 2017 | 8 | 2017 |
| Imaging a Sample with Multiple Beams and Multiple Detectors P Potocek, CS Kooijman, HN Slingerland, GNA Van Veen, F Boughorbel, ... US Patent App. 14/668,233, 2015 | 8 | 2015 |
| Composite scan path in a charged particle microscope P Potocek, CS Kooijman, HJ De Vos, HN Slingerland US Patent 10,002,742, 2018 | 6 | 2018 |
| Method of analyzing surface modification of a specimen in a charged-particle microscope P Potocek, F Boughorbel, MPW van den Boogaard, E Korkmaz US Patent 10,115,561, 2018 | 5 | 2018 |
| Training an artificial neural network using simulated specimen images L Strako, P Potocek US Patent 10,846,845, 2020 | 4 | 2020 |
| Object tracking using image segmentation P Potocek, E Korkmaz, R Schoenmakers US Patent App. 16/587,508, 2020 | 3 | 2020 |
| Charge reduction by digital image correlation R Geurts, P Potocek, B Larson US Patent 10,614,998, 2020 | 3 | 2020 |
| Sparse scanning electron microscopy for imaging and segmentation in connectomics P Potocek, R Schoenmakers, P Trampert, T Dahmen, M Peemen 2018 IEEE International Conference on Bioinformatics and Biomedicine (BIBM …, 2018 | 3 | 2018 |
| The Future SEM Sees 3 Dimensions... Bringing Deconvolution Techniques to the Electron Microscope. F Boughorbel, X Zhuge, P Potocek, L de Bruin, B Lich Microscopy and Microanalysis 19 (S2), 380-381, 2013 | 3 | 2013 |
