| Electronic and optical properties of strontium barium niobate single crystals B Andriyevsky, A Patryn, K Dorywalski, C Cobet, M Piasecki, I Kityk, ... Ferroelectrics 426 (1), 194-205, 2012 | 20 | 2012 |
| Ellipsometric study of near band gap optical properties of SrxBa1− xNb2O6 crystals K Dorywalski, B Andriyevsky, C Cobet, M Piasecki, IV Kityk, N Esser, ... Optical Materials 35 (5), 887-892, 2013 | 19 | 2013 |
| Spectroscopic ellipsometry technique as a materials characterization tool for mechatronic systems—The case of composition and doping concentration monitoring in SBN crystals K Dorywalski, I Maciejewski, T Krzyżyński Mechatronics 37, 33-41, 2016 | 16 | 2016 |
| Optical properties of epitaxial Na0. 5Bi0. 5TiO3 lead-free piezoelectric thin films: Ellipsometric and theoretical studies K Dorywalski, N Lemee, B Andriyevsky, R Schmidt-Grund, M Grundmann, ... Applied Surface Science 421, 367-372, 2017 | 15 | 2017 |
| Electronic Bands and Dielectric Functions of In0.5Tl0.5I Solid State Solution with Structural Defects B Andriyevsky, AI Kashuba, IM Kunyo, K Dorywalski, IV Semkiv, IV Karpa, ... Journal of Electronic Materials 48, 5586-5594, 2019 | 11 | 2019 |
| Comparative studies of the optical absorption coefficient spectra in the implanted layers in silicon with the use of nondestructive spectroscopic techniques K Dorywalski, Ł Chrobak, M Maliński Metrology and Measurement Systems 27 (2), 2020 | 10 | 2020 |
| Ultraviolet vacuum ultraviolet optical functions for SrTiO3 and NdGaO3 crystals determined by spectroscopic ellipsometry K Dorywalski, B Andriyevsky, M Piasecki, N Lemee, A Patryn, C Cobet, ... Journal of Applied Physics 114 (4), 2013 | 7 | 2013 |
| Spectral ellipsometry study of SBN single crystals in visible and ultraviolet region B Andriyevsky, K Dorywalski, I Kityk, M Piasecki, T Łukasiewicz, ... Ferroelectrics 417 (1), 14-19, 2011 | 7 | 2011 |
| Hybrid GA-gradient method for thin films ellipsometric data evaluation K Dorywalski, R Schmidt-Gründ, M Grundmann Journal of Computational Science 47, 101201, 2020 | 6 | 2020 |
| Electronic Properties of KDP and DKDP Crystals: Ab-Initio Calculations and Spectral Ellipsometry Experiment B Andriyevsky, A Patryn, C Cobet, J Przesławski, B Kosturek, N Esser, ... Ferroelectrics 417 (1), 20-24, 2011 | 6 | 2011 |
| Parametrized optical functions of strontium barium niobate crystals in the vacuum ultraviolet spectral range K Dorywalski, B Andriyevsky, M Piasecki, I Kityk Journal of Applied Physics 122 (11), 2017 | 3 | 2017 |
| Combination of a global-search method with model selection criteria for the ellipsometric data evaluation of DLC coatings K Dorywalski, O Lupicka, M Grundmann, C Sturm Advanced Optical Technologies 11 (5-6), 173-178, 2022 | 2 | 2022 |
| Structural phase transitions in ferroelectric crystals and thin films studied by VUV spectroscopic ellipsometry with synchrotron radiation K Dorywalski, B Andriyevsky, M Piasecki, I Kityk, C Cobet, N Esser, ... Phase Transitions 86 (9), 932-940, 2013 | 2 | 2013 |
| Spectral ellipsometry study in the range of electronic excitations and band structure of [(CH3) 2CHNH3] 4Cd3Cl10 crystals B Andriyevsky, K Dorywalski, M Jaskólski, Z Czapla, A Patryn, N Esser Materials Chemistry and Physics 139 (2-3), 770-774, 2013 | 2 | 2013 |
| Technika elipsometrii spektroskopowej jako metoda monitorowania jakości powierzchni materiałów grupy SrxBa1-xNb2O6 K Dorywalski, A Patryn Przegląd Elektrotechniczny 90 (9), 22-25, 2014 | 1 | 2014 |
| Synchrotron-based VUV spectroscopic ellipsometry system in application to optical properties studies of wide-bandgap materials for optoelectronics K DORYWALSKI, A PATRYN, B ANDRIYEVSKY, C COBET, N ESSER Przegląd Elektrotechniczny 90 (3), 243--246, 2014 | 1 | 2014 |
| Specific features of Yb3+ ions in electronic band energy structure and optical functions of RbNd (WO4) 2 crystals: Synchrotron ellipsometry measurements and DFT simulations B Andriyevsky, M Piasecki, K Dorywalski, C Cobet, N Esser, M Świrkowicz, ... Journal of alloys and compounds 577, 237-246, 2013 | 1 | 2013 |
| Wettability, Adsorption and Adhesion in Polymer (PMMA)—Commercially Available Mouthrinse System S Pogorzelski, P Janowicz, K Dorywalski, K Boniewicz-Szmyt, ... Materials 16 (17), 5753, 2023 | | 2023 |
| The optical properties of In2S3 films in the far-infrared spectral range B Andriyevsky, L Bychto, K Dorywalski, U Schade, L Puskar, A Patryn, ... Infrared Physics & Technology 131, 104662, 2023 | | 2023 |
| The Optimization Problem in Spectroscopic Ellipsometry Technique: Optical Spectra Determination for Pb5Ge3O11 Crystal K Dorywalski, T Krzyżyński Machine Dynamics Research 39 (4), 21-30, 2015 | | 2015 |
