| Combined differential and common-mode scattering parameters: Theory and simulation DE Bockelman, WR Eisenstadt IEEE transactions on microwave theory and techniques 43 (7), 1530-1539, 1995 | 928 | 1995 |
| S-parameter-based IC interconnect transmission line characterization WR Eisenstadt, Y Eo IEEE transactions on components, hybrids, and manufacturing technology 15 (4 …, 1992 | 768 | 1992 |
| High-speed VLSI interconnect modeling based on S-parameter measurements Y Eo, WR Eisenstadt IEEE Transactions on Components, Hybrids, and Manufacturing Technology 16 (5 …, 1993 | 387 | 1993 |
| Microwave differential circuit design using mixed mode s-parameters W Eisenstadt, R Stengel, B Thompson Artech, 2006 | 380 | 2006 |
| Pure-mode network analyzer for on-wafer measurements of mixed-mode S-parameters of differential circuits DE Bockelman, WR Eisenstadt IEEE Transactions on Microwave Theory and Techniques 45 (7), 1071-1077, 1997 | 201 | 1997 |
| LINC power amplifier combiner method efficiency optimization B Stengel, WR Eisenstadt IEEE Transactions on Vehicular Technology 49 (1), 229-234, 2000 | 172 | 2000 |
| A new on-chip interconnect crosstalk model and experimental verification for CMOS VLSI circuit design Y Eo, WR Eisenstadt, JY Jeong, OK Kwon IEEE transactions on Electron Devices 47 (1), 129-140, 2000 | 90 | 2000 |
| A translinear RMS detector for embedded test of RF ICs Q Yin, WR Eisenstadt, RM Fox, T Zhang IEEE Transactions on Instrumentation and Measurement 54 (5), 1708-1714, 2005 | 89 | 2005 |
| Embedded loopback test for RF ICs JS Yoon, WR Eisenstadt IEEE Transactions on Instrumentation and Measurement 54 (5), 1715-1720, 2005 | 84 | 2005 |
| Bipolar microwave RMS power detectors T Zhang, WR Eisenstadt, RM Fox, Q Yin IEEE Journal of Solid-State Circuits 41 (9), 2188-2192, 2006 | 83 | 2006 |
| Method and apparatus for calibrating a network analyzer DE Bockelman, WR Eisenstadt US Patent 5,793,213, 1998 | 82 | 1998 |
| A novel 5GHz RF power detector T Zhang, WR Eisenstadt, RM Fox 2004 IEEE International Symposium on Circuits and Systems (ISCAS) 1, I-897, 2004 | 64 | 2004 |
| Accuracy estimation of mixed-mode scattering parameter measurements DE Bockelman, WR Eisenstadt, R Stengel IEEE Transactions on Microwave theory and techniques 47 (1), 102-105, 1999 | 60 | 1999 |
| Combined differential and common-mode analysis of power splitters and combiners DE Bockelman, WR Eisenstadt IEEE Transactions on Microwave Theory and Techniques 43 (11), 2627-2632, 1995 | 60 | 1995 |
| Broadband active balun using combined cascode–cascade configuration K Jung, WR Eisenstadt, RM Fox, AW Ogden, J Yoon IEEE transactions on microwave theory and techniques 56 (8), 1790-1796, 2008 | 49 | 2008 |
| New simultaneous switching noise analysis and modeling for high-speed and high-density CMOS IC package design Y Eo, WR Eisenstadt, JY Jeong, OK Kwon IEEE transactions on advanced packaging 23 (2), 303-312, 2000 | 47 | 2000 |
| Improvement in electrical and dielectric behavior of (B a, S r) TiO 3 thin films by Ag doping A Srivastava, D Kumar, RK Singh, H Venkataraman, WR Eisenstadt Physical Review B 61 (11), 7305, 2000 | 47 | 2000 |
| X-ray imaging system and solid state detector therefor JD Cox, WR Eisenstadt, RM Fox US Patent 5,440,130, 1995 | 47 | 1995 |
| Embedded phase noise measurement system WR Eisenstadt, JS Kim US Patent 7,952,408, 2011 | 45 | 2011 |
| IIP3 estimation from the gain compression curve C Cho, WR Eisenstadt, B Stengel, E Ferrer IEEE transactions on microwave theory and techniques 53 (4), 1197-1202, 2005 | 44 | 2005 |
