| Microbeam heavy-ion single-event effect on Xilinx 28-nm system on chip W Yang, X Du, C He, S Shi, L Cai, N Hui, G Guo, C Huang IEEE Transactions on Nuclear Science 65 (1), 545-549, 2017 | 24 | 2017 |
| Atmospheric neutron single event effect test on Xilinx 28 nm system on chip at CSNS-BL09 W Yang, Y Li, Y Li, Z Hu, F Xie, C He, S Wang, B Zhou, H He, W Khan, ... Microelectronics Reliability 99, 119-124, 2019 | 20 | 2019 |
| Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip X Du, S Liu, D Luo, Y Zhang, X Du, C He, X Ren, W Yang, Y Yuan Microelectronics Reliability 71, 65-70, 2017 | 19 | 2017 |
| Radiation-Resistant CsPbBr3 Nanoplate-Based Lasers T Wang, W Yang, B Li, R Bian, X Jia, H Yu, L Wang, X Li, F Xie, H Zhu, ... ACS Applied Nano Materials 3 (12), 12017-12024, 2020 | 14 | 2020 |
| Reliability Assessment on 16nm Ultrascale+ MPSoC Using Fault Injection and Fault Tree Analysis LS Weitao Yang, Boyang Du, Chaohui He Microelectronics Reliability 120, 114122, 2021 | 11 | 2021 |
| Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis WT Yang, XC Du, YH Li, CH He, G Guo, ST Shi, L Cai, S Azimi, C De Sio, ... Nuclear Science and Techniques 32 (10), 106, 2021 | 10 | 2021 |
| Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam W Yang, X Du, J Guo, J Wei, G Du, C He, W Liu, S Shen, C Huang, Y Li, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2019 | 8 | 2019 |
| Investigation of single event effect in 28-nm system-on-chip with multi patterns WT Yang, YH Li, YX Guo, HY Zhao, Y Li, P Li, CH He, G Guo, J Liu, ... Chinese Physics B 29 (10), 108504, 2020 | 7 | 2020 |
| Single-event effects induced by medium-energy protons in 28 nm system-on-chip WT Yang, Q Yin, Y Li, G Guo, YH Li, CH He, YW Zhang, FQ Zhang, ... Nuclear Science and Techniques 30 (10), 151, 2019 | 7 | 2019 |
| Measurement of single event effects induced by alpha particles in the Xilinx Zynq-7010 System-on-Chip X Du, C He, S Liu, Y Zhang, Y Li, W Yang Journal of Nuclear Science and Technology 54 (3), 287-292, 2017 | 7 | 2017 |
| Electron inducing soft errors in 28 nm system-on-Chip W Yang, Y Li, W Zhang, Y Guo, H Zhao, J Wei, Y Li, C He, K Chen, G Guo, ... Radiation Effects and Defects in Solids 175 (7-8), 745-754, 2020 | 6 | 2020 |
| A detector system for searching lost γ-ray source W Khan, C He, Y Cao, R Khan, W Yang Nuclear Engineering and Technology 52 (7), 1524-1531, 2020 | 6 | 2020 |
| Proton-induced current transient in SiGe HBT and charge collection model based on Monte Carlo simulation JN Wei, Y Li, WT Yang, CH He, YH Li, H Zang, P Li, JX Zhang, G Guo Science China Technological Sciences 63 (5), 851-858, 2020 | 6 | 2020 |
| Design of CsI (TI) detector system to search for lost radioactive source W Khan, CH He, QM Zhang, Y Cao, WT Yang Nuclear Science and Techniques 30, 1-9, 2019 | 6 | 2019 |
| Atmospheric neutron single event effect in 65 nm microcontroller units by using CSNS-BL09 H Zhi-Liang, Y Wei-Tao, L Yong-Hong, L Yang, H Chao-Hui, W Song-Lin, ... Acta Physica Sinica 68 (23), 2019 | 5 | 2019 |
| Fault injection and failure analysis on Xilinx 16 nm FinFET Ultrascale+ MPSoC W Yang, Y Li, C He Nuclear Engineering and Technology 54 (6), 2031-2036, 2022 | 4 | 2022 |
| A novel (B4Cp+ Gd)/Al6061 neutron absorber material with desirable mechanical properties M Chen, Z Liu, C Yang, P Xiao, W Yang, Z Hu, L Sun, Y Jia Materials Science and Engineering: A 861, 144376, 2022 | 3 | 2022 |
| A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit S Azimi, C De Sio, W Yang, L Sterpone 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS …, 2020 | 3 | 2020 |
| Analysis of sensitive blocks of soft errors in the Xilinx Zynq-7000 System-on-Chip X Du, C He, S Liu, D Luo, X Du, W Yang, Y Li, Y Fan Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2019 | 3 | 2019 |
| System-on-chip single event effect hardening design and validation using proton irradiation W Yang, Y Li, G Guo, C He, L Wu Nuclear Engineering and Technology 55 (3), 1015-1020, 2023 | 2 | 2023 |
