| Knowledge graphs as enhancers of intelligent digital twins N Sahlab, S Kamm, T Müller, N Jazdi, M Weyrich 2021 4th IEEE international conference on industrial cyber-physical systems …, 2021 | 53 | 2021 |
| Deep industrial transfer learning at runtime for image recognition B Maschler, S Kamm, M Weyrich at-Automatisierungstechnik 69 (3), 211-220, 2021 | 22 | 2021 |
| Distributed cooperative deep transfer learning for industrial image recognition B Maschler, S Kamm, N Jazdi, M Weyrich Procedia CIRP 93, 437-442, 2020 | 22 | 2020 |
| Architecture and knowledge modelling for self-organized reconfiguration management of cyber-physical production systems T Müller, S Kamm, A Löcklin, D White, M Mellinger, N Jazdi, M Weyrich International Journal of Computer Integrated Manufacturing 36 (12), 1842-1863, 2023 | 20 | 2023 |
| A survey on machine learning based analysis of heterogeneous data in industrial automation S Kamm, SS Veekati, T Müller, N Jazdi, M Weyrich Computers in Industry 149, 103930, 2023 | 19 | 2023 |
| Knowledge discovery in heterogeneous and unstructured data of industry 4.0 systems: challenges and approaches S Kamm, N Jazdi, M Weyrich Procedia CIRP 104, 975-980, 2021 | 16 | 2021 |
| A Hybrid Modelling Approach for Parameter Estimation of Analytical Reflection Models in the Failure Analysis Process of Semiconductors S Kamm, K Sharma, N Jazdi, M Weyrich 2021 IEEE 17th International Conference on Automation Science and …, 2021 | 6 | 2021 |
| Characterization of Online Junction Temperature of the SiC power MOSFET by Combination of Four TSEPs using Neural Network K Sharma, S Kamm, KM Barón, I Kallfass 2022 24th European Conference on Power Electronics and Applications (EPE'22 …, 2022 | 5 | 2022 |
| Hybrid Modelling for the Failure Analysis of SiC Power Transistors on Time-Domain Reflectometry Data S Kamm, K Sharma, I Kallfass, N Jazdi, M Weyrich 2021 IEEE International Symposium on the Physical and Failure Analysis of …, 2021 | 5 | 2021 |
| Simulation-to-reality based transfer learning for the failure analysis of SiC power transistors S Kamm, S Bickelhaupt, K Sharma, N Jazdi, I Kallfass, M Weyrich 2022 IEEE 27th International Conference on Emerging Technologies and Factory …, 2022 | 4 | 2022 |
| Non-Destructive Failure Analysis of Power Devices via Time-Domain Reflectometry K Sharma, S Kamm, V Afanasenko, KM Barón, I Kallfass 2021 IEEE 17th International Conference on Automation Science and …, 2021 | 4 | 2021 |
| A Concept for Dynamic and Robust Machine Learning with Context Modeling for Heterogeneous Manufacturing Data S Kamm, N Sahlab, N Jazdi, M Weyrich | 3 | 2022 |
| Context-enriched modeling using Knowledge Graphs for intelligent Digital Twins of Production Systems T Müller, N Sahlab, S Kamm, C Köhler, D Braun, N Jazdi, M Weyrich 2022 IEEE 27th International Conference on Emerging Technologies and Factory …, 2022 | 2 | 2022 |
| An Architecture for Adaptive Machine Learning Models using Adversarial and Transfer Learning S Kamm, P Kumar, N Jazdi, M Weyrich Procedia CIRP 120, 1451-1456, 2023 | 1 | 2023 |
| InteLiv: An Architecture for Graph-Based Dynamic Context Modeling for Smart Living J Stümpfle, N Sahlab, S Kamm, P Grimmeisen, N Jazdi, M Weyrich 2023 IEEE 28th International Conference on Emerging Technologies and Factory …, 2023 | | 2023 |
| A Novel Architecture for Robust and Adaptive Machine Learning Using Heterogeneous Data in Condition Monitoring of Automation Systems S Kamm, PR Suthandhira, N Jazdi, M Weyrich 2023 IEEE 28th International Conference on Emerging Technologies and Factory …, 2023 | | 2023 |
| A modular Approach for Multimodal Deep Learning for Object Detection of Mobile Robots S Kamm, N Jazdi, S Yang, M Weyrich | | 2023 |
| Hybrid Model of Power MOSFET for Soft Failures Estimation Based on Time Domain Reflectometry and Machine Learning V Afanasenko, K Sharma, S Kamm, I Kallfass 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE …, 2023 | | 2023 |
| Time-Domain Reflectometry for Automated Failure Analysis in Power Transistors K Sharma, S Kamm, V Afansenko, KM Barón, I Kallfass Procedia CIRP 118, 1114-1119, 2023 | | 2023 |
| Automatisierte Datenintegration für den Fehleranalyseprozess von Halbleiterbauelementen mithilfe von Ontologien und Graphen S Kamm, N Jazdi, M Weyrich | | 2021 |
Michael WeyrichProfessor für Automatisierungstechnik und Softwaresysteme, Universität StuttgartBestätigte E-Mail-Adresse bei ias.uni-stuttgart.de
