| Code generation using machine learning: A systematic review E Dehaerne, B Dey, S Halder, S De Gendt, W Meert Ieee Access 10, 82434-82455, 2022 | 31 | 2022 |
| Neuro-NoC: Energy optimization in heterogeneous many-core NoC using neural networks in dark silicon era MF Reza, TT Le, B De, M Bayoumi, D Zhao 2018 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2018 | 28 | 2018 |
| A novel reconfigurable hardware architecture of neural network K Khalil, O Eldash, B Dey, A Kumar, M Bayoumi 2019 IEEE 62nd International Midwest Symposium on Circuits and Systems …, 2019 | 23 | 2019 |
| SEM image denoising with unsupervised machine learning for better defect inspection and metrology B Dey, S Halder, K Khalil, G Lorusso, J Severi, P Leray, MA Bayoumi Metrology, Inspection, and Process Control for Semiconductor Manufacturing …, 2021 | 22 | 2021 |
| Deep learning-based defect classification and detection in SEM images B Dey, D Goswami, S Halder, K Khalil, P Leray, MA Bayoumi Metrology, Inspection, and Process Control XXXVI 12053, 2022 | 21 | 2022 |
| Optimizing YOLOv7 for semiconductor defect detection E Dehaerne, B Dey, S Halder, S De Gendt Metrology, Inspection, and Process Control XXXVII 12496, 635-642, 2023 | 12 | 2023 |
| A novel design gate based low-cost configurable ro puf using reversible logic B Dey, K Khalil, A Kumar, M Bayoumi 2019 IEEE 62nd International Midwest Symposium on Circuits and Systems …, 2019 | 12 | 2019 |
| A reversible-logic based architecture for long short-term memory (LSTM) network K Khalil, B Dey, A Kumar, M Bayoumi 2021 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2021 | 11 | 2021 |
| A reversible-logic based architecture for artificial neural network B Dey, K Khalil, A Kumar, M Bayoumi 2020 IEEE 63rd International Midwest Symposium on Circuits and Systems …, 2020 | 9 | 2020 |
| Unsupervised machine learning based CD-SEM image segregator for OPC and process window estimation B Dey, D Cerbu, K Khalil, S Halder, P Leray, S Das, Y Sherazi, ... Design-Process-Technology Co-optimization for Manufacturability XIV 11328 …, 2020 | 9 | 2020 |
| Towards improving challenging stochastic defect detection in SEM images based on improved YOLOv5 B Dey, E Dehaerne, S Halder Photomask Technology 2022 12293, 28-37, 2022 | 8 | 2022 |
| Architecture of a novel low-cost hardware neural network K Khalil, O Eldash, B Dey, A Kumar, M Bayoumi 2020 IEEE 63rd International Midwest Symposium on Circuits and Systems …, 2020 | 7 | 2020 |
| Unsupervised machine learning based SEM image denoising for robust contour detection B Dey, S Wu, S Das, K Khalil, S Halder, P Leray, S Bhamidipati, K Ahi, ... International Conference on Extreme Ultraviolet Lithography 2021 11854, 88-102, 2021 | 5 | 2021 |
| A low power hardware implementation of multi-object DPM detector for autonomous driving A Ali, OG Olaleye, B Dey, K Khalil, MA Bayoumi 2018 IEEE International Conference on Acoustics, Speech and Signal …, 2018 | 5 | 2018 |
| YOLOv8 for defect inspection of hexagonal directed self-assembly patterns: a data-centric approach E Dehaerne, B Dey, H Esfandiar, L Verstraete, HS Suh, S Halder, ... 38th European Mask and Lithography Conference (EMLC 2023) 12802, 286-299, 2023 | 4 | 2023 |
| A comparative study of deep-learning object detectors for semiconductor defect detection E Dehaerne, B Dey, S Halder 2022 29th IEEE International Conference on Electronics, Circuits and Systems …, 2022 | 4 | 2022 |
| Joren Severi, Philippe Leray, Magdy A B Dey, S Halder, K Khalil, G Lorusso Bayoumi,“SEM image denoising with Unsupervised Machine Learning for better …, 2021 | 4 | 2021 |
| A novel design reversible logic based configurable fault-tolerant embryonic hardware K Khalil, B Dey, Y Sherazi, A Kumar, M Bayoumi 2020 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2020 | 4 | 2020 |
| Spectrum-awareness-based performance and scalability of cognitive radio networks OG Olaleye, A Ali, K Khalil, B Dey, D Perkins, M Bayoumi 2018 IEEE International Conference on Communications Workshops (ICC …, 2018 | 4 | 2018 |
| SEMI-PointRend: improved semiconductor wafer defect classification and segmentation as rendering MJ Hwang, B Dey, E Dehaerne, S Halder, Y Shin Metrology, Inspection, and Process Control XXXVII 12496, 25-31, 2023 | 3 | 2023 |
Kasem KhalilAssistant ProfessorVerified email at aun.edu.eg
