| Influence of microstructure and hydrogen concentration on amorphous silicon crystallization N Budini, PA Rinaldi, JA Schmidt, RD Arce, RH Buitrago Thin Solid Films 518 (18), 5349-5354, 2010 | 55 | 2010 |
| Characterization of fluorine-doped tin oxide produced by the pyrosol method B Gottlieb, R Koropecki, R Arce, R Crisalle, J Ferron Thin Solid Films 199 (1), 13-21, 1991 | 55 | 1991 |
| Photo-oxidation effects in porous silicon luminescence RR Koropecki, RD Arce, JA Schmidt Physical Review B 69 (20), 205317, 2004 | 49 | 2004 |
| Density of states in the gap of amorphous semiconductors determined from modulated photocurrent measurements in the recombination regime RR Koropecki, JA Schmidt, R Arce Journal of applied physics 91 (11), 8965-8969, 2002 | 42 | 2002 |
| Infrared study of the Si‐H stretching band in a‐SiC:H RR Koropecki, F Alvarez, R Arce Journal of applied physics 69 (11), 7805-7811, 1991 | 33 | 1991 |
| Direct evidence of porosity in carbon‐rich hydrogenated amorphous silicon carbide films R Arce, RR Koropecki, RH Buitrago, F Alvarez, I Chambouleyron Journal of applied physics 66 (9), 4544-4546, 1989 | 33 | 1989 |
| Infrared study of the kinetics of oxidation in porous amorphous silicon RR Koropecki, R Arce Journal of applied physics 60 (5), 1802-1807, 1986 | 33 | 1986 |
| Structural analysis of ZnO (: Al, Mg) thin films by X-ray diffraction FA Garcés, N Budini, RR Koropecki, RD Arce Procedia Materials Science 8, 551-560, 2015 | 32 | 2015 |
| Structural and magnetic properties of a copper–amino acid salt: Copper (II) bis (α‐amino isobutyrato) R Calvo, MA Mesa, G Oliva, J Zukerman‐Schpector, OR Nascimento, ... The Journal of chemical physics 81 (10), 4584-4591, 1984 | 32 | 1984 |
| Effect of thickness on structural and electrical properties of Al-doped ZnO films FA Garcés, N Budini, RD Arce, JA Schmidt Thin solid films 574, 162-168, 2015 | 29 | 2015 |
| Analysis of random telegraph noise in large-area amorphous double-barrier structures T Teuschler, M Hundhausen, L Ley, R Arce Physical Review B 47 (19), 12687, 1993 | 27 | 1993 |
| Structural mosaicity and electrical properties of pyrolytic SnO2: F thin films FA Garcés, N Budini, RR Koropecki, RD Arce Thin Solid Films 531, 172-178, 2013 | 26 | 2013 |
| Power-law photoconductivity time decay in nanocrystalline TiO2 thin films D Comedi, SP Heluani, M Villafuerte, RD Arce, RR Koropecki Journal of Physics: Condensed Matter 19 (48), 486205, 2007 | 26 | 2007 |
| Photoinduced phenomena in nanostructured porous silicon RD Arce, RR Koropecki, G Olmos, AM Gennaro, JA Schmidt Thin Solid Films 510 (1-2), 169-174, 2006 | 26 | 2006 |
| Polycrystalline silicon thin film solar cells prepared by PECVD-SPC RH Buitrago, GA Risso, M Cutrera, M Battioni, L De Bernardez, ... International Journal of Hydrogen Energy 33 (13), 3522-3525, 2008 | 25 | 2008 |
| Light-induced defects in hydrogenated amorphous silicon studied by the constant-photocurrent method JA Schmidt, R Arce, RH Buitrago, RR Koropecki Physical Review B 55 (15), 9621, 1997 | 23 | 1997 |
| Time and field dependence of the magnetization in AuFe, AgMn, and ThGd spin glasses S Oseroff, M Mesa, M Tovar, R Arce Journal of Applied Physics 53 (3), 2208-2210, 1982 | 23 | 1982 |
| Infrared studies combined with hydrogen effusion experiments on nanostructured porous silicon RR Koropecki, RD Arce, JA Schmidt Journal of non-crystalline solids 338, 159-162, 2004 | 22 | 2004 |
| Light-induced creation of metastable defects in hydrogenated amorphous silicon studied by computer simulations of constant photocurrent measurements JA Schmidt, RD Arce, RR Koropecki, RH Buitrago Physical Review B 59 (7), 4568, 1999 | 20 | 1999 |
| Thickness dependence of crystalline structure of Al-doped ZnO thin films deposited by spray pyrolysis FA Garcés, N Budini, RD Arce, JA Schmidt Procedia Materials Science 9, 221-229, 2015 | 19 | 2015 |
Roberto KoropeckiIFIS-UNL-CONICET; ArgentinaVerified email at ifis.santafe-conicet.gov.ar
