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Co-authors
- Taesung KimSungkyunkwan UniversityVerified email at skku.edu
- Hyeong-U KimKIMM, USTVerified email at kimm.re.kr
- Jinill ChoSungkyunkwan UniversityVerified email at skku.edu
- Kim EungchulSamsung ElectronicsVerified email at samsung.com
- Pil J. YooProfessor, School of Chemical Engineering, Sungkyunkwan University (SKKU)Verified email at skku.edu
- Jae-Hyun LeeDepartment of Materials Science and Engineering, Ajou UniversityVerified email at ajou.ac.kr
- JAEWON LEESchool of Mechanical Engineering, Sungkyunkwan University (SKKU), Gyeonggi-do 16419, Republic ofVerified email at skku.edu
- Sihoon SonSungkyunkwan UniversityVerified email at skku.edu
- Min-Ho LeeChung-Ang UniversityVerified email at cau.ac.kr
- Keon-Woo KimPOSTECHVerified email at postech.ac.kr
- Dr. Yonas Tesgaye MegraPostdoc, Gwangju Institute of Science and TechnologyVerified email at gist.ac.kr
- Muyoung KimSenior Researcher, Department of Plasma Engineering, Korea Institute of Machinery and MaterialsVerified email at kimm.re.kr
- Jinhyoung LeeSungkyunkwan University M.S & Ph.D Combined CourseVerified email at g.skku.edu
- Dongho LeeSungkyunkwan UniversityVerified email at g.skku.edu
- Gunhoo WooPh.D. course of nano science and technology, Sungkyunkwan Univ.Verified email at skku.edu
- Hyo-Chang Lee (이효창)Korea Research Institute of Standards and ScienceVerified email at hanyang.ac.kr
- Jihun MunKorea Research Institute of Standards and ScienceVerified email at kriss.re.kr
- Hyunbin ChoiSUNGKYUNKWAN UNIVERSITYVerified email at skku.edu
- Seokjun HongSemiconductor R&D Center, Samsung Electronics