SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts S Pandey, Z Liao, S Nandi, S Gupta, S Natarajan, A Sinha, A Singh, ... 2020 IEEE International Test Conference (ITC), 1-10, 2020 | 7 | 2020 |
Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts S Pandey, Z Liao, S Nandi, S Natarajan, A Sinha, A Singh, A Chatterjee 2021 IEEE 39th VLSI Test Symposium (VTS), 1-7, 2021 | 3 | 2021 |
MOEMS accelerometer based on grating coupler integrated with embossed diaphragm M Balasubramanian, S Nandi, S Fathima, S Aparna, SS Vuppala, ... Conference on Lasers and Electro-Optics/Pacific Rim, s1633, 2017 | 3 | 2017 |