| Impurity control in high performance multicrystalline silicon G Stokkan, DS Marisa, R Søndenå, M Juel, A Autruffe, K Adamczyk, ... physica status solidi (a) 214 (7), 1700319, 2017 | 30 | 2017 |
| Characterization of oxidation-induced stacking fault rings in Cz silicon: Photoluminescence imaging and visual inspection after wright etch H Angelskår, R Søndenå, MS Wiig, ES Marstein Energy Procedia 27, 160-166, 2012 | 29 | 2012 |
| Hydrogen-related defects measured by infrared spectroscopy in multicrystalline silicon wafers throughout an illuminated annealing process PM Weiser, E Monakhov, H Haug, MS Wiig, R Søndenå Journal of Applied Physics 127 (6), 2020 | 25 | 2020 |
| Characterization of the OSF-band structure in n-type Cz-Si using photoluminescence-imaging and visual inspection R Søndenå, Y Hu, M Juel, MS Wiig, H Angelskår Journal of crystal growth 367, 68-72, 2013 | 22 | 2013 |
| Temperature dependent photoluminescence imaging calibrated by photoconductance measurements H Haug, R Søndenå, MS Wiig, ES Marstein Energy Procedia 124, 47-52, 2017 | 21 | 2017 |
| The effect of phosphorus diffusion gettering on recombination at grain boundaries in HPMC-Silicon wafers MS Wiig, K Adamczyk, H Haug, KE Ekstrøm, R Søndenå Energy Procedia 92, 886-895, 2016 | 16 | 2016 |
| A high-accuracy calibration method for temperature dependent photoluminescence imaging ST Kristensen, S Nie, MS Wiig, H Haug, C Berthod, R Strandberg, ... AIP Conference Proceedings 2147 (1), 2019 | 13 | 2019 |
| Simulating the effect of lifetime non-uniformity on solar cell performance using cmd-PC1D 6 and Griddler 2 H Haug, MS Wiig, R Søndenå, J Wong Energy Procedia 92, 69-74, 2016 | 13 | 2016 |
| Modeling of recombination strength at grain boundaries after phosphorus diffusion gettering and the effect of hydrogen passivation MS Wiig, H Haug, R Søndenå, ES Marstein Energy Procedia 124, 215-224, 2017 | 12 | 2017 |
| Evolution of the light sensitive defects in high performance multicrystalline silicon wafers R Søndenå, MS Wiig Journal of Applied Physics 125 (8), 2019 | 11 | 2019 |
| Degradation analysis of utility-scale PV plants in different climate zones SW Adler, MS Wiig, Å Skomedal, H Haug, ES Marstein IEEE Journal of Photovoltaics 11 (2), 513-518, 2020 | 8 | 2020 |
| Evolution of defect densities with height in a HPMC-Si ingot R Søndenå, H Haug, CC You, J Zhu, MS Wiig AIP Conference Proceedings 2147 (1), 2019 | 8 | 2019 |
| Is it possible to unambiguously assess the presence of two defects by temperature-and injection-dependent lifetime spectroscopy? TU Nærland, S Bernardini, MS Wiig, MI Bertoni IEEE Journal of Photovoltaics 8 (2), 465-472, 2018 | 8 | 2018 |
| The Influence of Minority Carrier Density on Degradation and Regeneration Kinetics in Multicrystalline Silicon Wafers GM Wyller, MS Wiig, I Due-Sørensen, R Søndenå IEEE Journal of Photovoltaics 11 (4), 878-889, 2021 | 7 | 2021 |
| Lifetime spectroscopy with high spatial resolution based on temperature-and injection dependent photoluminescence imaging H Haug, R Søndenå, A Berg, MS Wiig Solar Energy Materials and Solar Cells 200, 109994, 2019 | 7 | 2019 |
| Temperature dependent quantum efficiencies in multicrystalline silicon solar cells R Søndenå, C Berthod, JO Odden, AK Søiland, MS Wiig, ES Marstein Energy Procedia 77, 639-645, 2015 | 7 | 2015 |
| Identifying recombination parameters by injection-dependent lifetime spectroscopy on mc-silicon based on photoluminescence imaging MS Wiig, H Haug, R Søndenå, ES Marstein AIP Conference Proceedings 1999 (1), 2018 | 2 | 2018 |
| Temperature coefficients in compensated silicon solar cells investigated by temperature dependent lifetime measurements and numerical device simulation H Haug, Å Skomeland, R Søndenå, MS Wiig, C Berthod, ES Marstein AIP conference proceedings 1999 (1), 2018 | 2 | 2018 |
| Combined degradation and soiling with validation against independent soiling station measurements MM Nygård, ÅF Skomedal, MS Wiig, ES Marstein IEEE Journal of Photovoltaics 13 (2), 296-304, 2023 | 1 | 2023 |
| Comparison between dark and illuminated annealing of compensated and uncompensated mc-Si wafers GM Wyller, MS Wiig, B Thomassen, R Søndenå AIP Conference Proceedings 2487 (1), 2022 | 1 | 2022 |
