| Explainable deep learning system for advanced silicon and silicon carbide electrical wafer defect map assessment RE Sarpietro, C Pino, S Coffa, A Messina, S Palazzo, S Battiato, ... IEEE Access 10, 99102-99128, 2022 | 9 | 2022 |
| Hybrid Deep Learning Pipeline for Advanced Electrical Wafer Defect Maps Assessment F Rundo, M Coffa, Salvatore, Calabretta, RE Sarpietro, A Messina, C Pino, ... AEIT 2022, 2022 | 2 | 2022 |
| SARS-CoV-2 Induced Pneumonia Early Detection System Based on Chest X-Ray Images Analysis by Jacobian-Regularized Deep Network F Rundo, C Pino, RE Sarpietro, C Spampinato International Conference on Pattern Recognition, 602-616, 2022 | 1 | 2022 |
| System and Method for Power Module Defect Detection M Calabretta, F Rundo, S Coffa, MA Torrisi, RE Sarpietro US Patent App. 18/168,017, 2024 | | 2024 |
| MACHINE LEARNING TECHNIQUES FOR WAFER DEFECT MAP CLASSIFICATION F Rundo, S Coffa, RE Sarpietro, C Spampinato, PC Giuffre, G Randazzo, ... US Patent App. 18/068,944, 2024 | | 2024 |
| Hype, Media Frenzy, and Mass Societal Hysteria: Perspectives on Human-imitative Intelligence R Saqur, RE Sarpietro, M Shaheer, MC Buehler | | 2023 |
| Bio-inspired Embedded System for Intelligent Driving Assistance in the Next Generation Cars F Rundo, RE Sarpietro, S Battiato 2022 AEIT International Annual Conference (AEIT), 1-6, 2022 | | 2022 |
| A Hierarchical 3D Segmentation Model for Cone-Beam Computed Tomography Dental-Arch Scans F Rundo, C Pino, RE Sarpietro, C Spampinato, FP Salanitri International Conference on Pattern Recognition, 589-601, 2022 | | 2022 |
| Deep Learning for Intelligent Wafer Defect Pattern Recognition System F Rundo, A Messina, M Calabretta, C Pino, C Spampinato, RE Sarpietro, ... Ital-IA, 2022 | | 2022 |
| Autonomous Agents Research Group S Albrecht, F Christianos, L Schäfer, T McInroe, M Dunion, A Jelley, ... | | 2020 |
