| Accelerated degradation analysis for the quality of a system based on the gamma process MH Ling, KL Tsui, N Balakrishnan IEEE Transactions on Reliability 64 (1), 463-472, 2014 | 127 | 2014 |
| Battery state of health modeling and remaining useful life prediction through time series model CP Lin, J Cabrera, F Yang, MH Ling, KL Tsui, SJ Bae Applied Energy 275, 115338, 2020 | 87 | 2020 |
| Bayesian and likelihood inferences on remaining useful life in two-phase degradation models under gamma process MH Ling, HKT Ng, KL Tsui Reliability Engineering & System Safety 184, 77-85, 2019 | 79 | 2019 |
| Gamma lifetimes and one-shot device testing analysis N Balakrishnan, MH Ling Reliability Engineering & System Safety 126, 54-64, 2014 | 72 | 2014 |
| Expectation maximization algorithm for one shot device accelerated life testing with Weibull lifetimes, and variable parameters over stress N Balakrishnan, MH Ling IEEE Transactions on Reliability 62 (2), 537-551, 2013 | 65 | 2013 |
| Learning analytics for monitoring students participation online: Visualizing navigational patterns on learning management system LKM Poon, SC Kong, TSH Yau, M Wong, MH Ling Blended Learning. New Challenges and Innovative Practices: 10th …, 2017 | 53 | 2017 |
| Relationship between gerontological nursing education and attitude toward older people MHK Hsu, MH Ling, TL Lui Nurse education today 74, 85-90, 2019 | 48 | 2019 |
| EM algorithm for one-shot device testing under the exponential distribution N Balakrishnan, MH Ling Computational Statistics & Data Analysis 56 (3), 502-509, 2012 | 48 | 2012 |
| Prognostics for lithium-ion batteries using a two-phase gamma degradation process model CP Lin, MH Ling, J Cabrera, F Yang, DYW Yu, KL Tsui Reliability engineering & system safety 214, 107797, 2021 | 47 | 2021 |
| Best constant-stress accelerated life-test plans with multiple stress factors for one-shot device testing under a Weibull distribution N Balakrishnan, MH Ling IEEE transactions on reliability 63 (4), 944-952, 2014 | 47 | 2014 |
| Multiple-stress model for one-shot device testing data under exponential distribution N Balakrishnan, MH Ling IEEE Transactions on Reliability 61 (3), 809-821, 2012 | 47 | 2012 |
| Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions MH Ling, XW Hu Reliability Engineering & System Safety 193, 106630, 2020 | 43 | 2020 |
| EM algorithm for one-shot device testing with competing risks under exponential distribution N Balakrishnan, HY So, MH Ling Reliability Engineering & System Safety 137, 129-140, 2015 | 35 | 2015 |
| Healthcare intelligence: turning data into knowledge H Yang, E Kundakcioglu, J Li, T Wu, JR Mitchell, AK Hara, W Pavlicek, ... IEEE Intelligent Systems 29 (3), 54-68, 2014 | 35 | 2014 |
| EM algorithm for one-shot device testing with competing risks under Weibull distribution N Balakrishnan, HY So, MH Ling IEEE Transactions on Reliability 65 (2), 973-991, 2015 | 32 | 2015 |
| Confidence intervals for a difference between proportions based on paired data ML Tang, MH Ling, L Ling, G Tian Statistics in Medicine 29 (1), 86-96, 2010 | 27 | 2010 |
| Exact and approximate unconditional confidence intervals for proportion difference in the presence of incomplete data ML Tang, MH Ling, GL Tian Statistics in medicine 28 (4), 625-641, 2009 | 25 | 2009 |
| Full friendly index sets of Cartesian products of two cycles WC Shiu, MH Ling Acta Mathematica Sinica, English Series 26, 1233-1244, 2010 | 23 | 2010 |
| Accelerated life testing of one-shot devices: Data collection and analysis N Balakrishnan, MH Ling, HY So John Wiley & Sons, 2021 | 21 | 2021 |
| Model mis-specification analyses of Weibull and gamma models based on one-shot device test data MH Ling, N Balakrishnan IEEE Transactions on Reliability 66 (3), 641-650, 2017 | 21 | 2017 |
N BalakrishnanMcMaster UniversityVerified email at mcmaster.ca
