| Simple calibration of a phase-based 3D imaging system based on uneven fringe projection Z Zhang, H Ma, S Zhang, T Guo, CE Towers, DP Towers Optics letters 36 (5), 627-629, 2011 | 69 | 2011 |
| Simple, flexible calibration of phase calculation-based three-dimensional imaging system Z Zhang, H Ma, T Guo, S Zhang, J Chen Optics letters 36 (7), 1257-1259, 2011 | 62 | 2011 |
| Improvements in event-related desynchronization and classification performance of motor imagery using instructive dynamic guidance and complex tasks Y Bian, H Qi, L Zhao, D Ming, T Guo, X Fu Computers in biology and medicine 96, 266-273, 2018 | 38 | 2018 |
| Multi-wavelength phase-shifting interferometry for micro-structures measurement based on color image processing in white light interference T Guo, F Li, J Chen, X Fu, X Hu Optics and Lasers in Engineering 82, 41-47, 2016 | 35 | 2016 |
| Micro-motion analyzer used for dynamic MEMS characterization T Guo, H Chang, J Chen, X Fu, X Hu Optics and lasers in Engineering 47 (3-4), 512-517, 2009 | 29 | 2009 |
| Film thickness measurement based on nonlinear phase analysis using a Linnik microscopic white-light spectral interferometer T Guo, Z Chen, M Li, J Wu, X Fu, X Hu Applied Optics 57 (12), 2955-2961, 2018 | 28 | 2018 |
| Nanoscale oxide structures induced by dynamic electric field on Si with AFM X Hu, T Guo, X Fu, X Hu Applied surface science 217 (1-4), 34-38, 2003 | 24 | 2003 |
| Residual vibration control based on a global search method in a high-speed white light scanning interferometer Z Song, T Guo, X Fu, X Hu Applied Optics 57 (13), 3415-3422, 2018 | 18 | 2018 |
| Development of a hybrid atomic force microscopic measurement system combined with white light scanning interferometry T Guo, S Wang, DJ Dorantes-Gonzalez, J Chen, X Fu, X Hu Sensors 12 (1), 175-188, 2011 | 18 | 2011 |
| Microelectromechanical systems surface characterization based on white light phase shifting interferometry T Guo, L Ma, J Chen, X Fu, X Hu Optical Engineering 50 (5), 053606-053606-7, 2011 | 17 | 2011 |
| Characterization of static and dynamic microstructures by microscopic interferometry based on a Fourier transform method X Hu, G Liu, C Hu, T Guo, X Hu Measurement Science and Technology 17 (6), 1312, 2006 | 17 | 2006 |
| Microscopic fringe projection system and measuring method J Chen, T Guo, L Wang, Z Wu, X Fu, X Hu Eighth International Symposium on Precision Engineering Measurement and …, 2013 | 14 | 2013 |
| Study on structure optimization of a piezoelectric cantilever with a proof mass for vibration-powered energy harvesting system Y Li, W Li, T Guo, Z Yan, X Fu, X Hu Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009 | 14 | 2009 |
| Metrological atomic force microscope with self-sensing measuring head J Zhao, T Guo, L Ma, X Fu, X Hu Sensors and Actuators A: Physical 167 (2), 267-272, 2011 | 13 | 2011 |
| A unique self-sensing, self-actuating AFM probe at higher eigenmodes Z Wu, T Guo, R Tao, L Liu, J Chen, X Fu, X Hu Sensors 15 (11), 28764-28771, 2015 | 12 | 2015 |
| A nanomeasuring machine based white light tilt scanning interferometer for large scale optical array structure measurement T Guo, L Ma, J Zhao, DJ Dorantes-Gonzalez, X Fu, X Hu Optics and lasers in Engineering 49 (9-10), 1124-1130, 2011 | 12 | 2011 |
| Initial estimation of thin film thickness measurement based on white light spectral interferometry T Guo, J Wu, L Ni, X Fu, X Hu Thin Solid Films 612, 267-273, 2016 | 11 | 2016 |
| Thick film geometric parameters measurement by white light interferometry L Ma, T Guo, F Yuan, J Zhao, X Fu, X Hu 2009 International Conference on Optical Instruments and Technology: Optical …, 2009 | 11 | 2009 |
| Measuring in-plane and out-of-plane coupled motions of microstructures by stroboscopic microscopic interferometry X Hu, C Hu, Z Chen, T Guo, X Hu Optics & Laser Technology 39 (6), 1176-1182, 2007 | 11 | 2007 |
| Wavelength correction for thin film measurement in a microscopic white light spectral interferometer T Guo, M Li, Y Zhou, L Ni, X Fu, X Hu Optik 145, 188-201, 2017 | 9 | 2017 |
Zonghua ZhangHebei University of technologyVerified email at hebut.edu.cn
