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ELENA PASCUAL CORRAL
ELENA PASCUAL CORRAL
Profesora Titular de Universidad (Universidad de Salamanca)
Verified email at usal.es
Title
Cited by
Cited by
Year
Influence of the substrate on the diffusion coefficient and the momentum relaxation in graphene: The role of surface polar phonons
R Rengel, E Pascual, MJ Martín
Applied Physics Letters 104 (23), 2014
562014
Clarithromycin-induced leukocytoclastic vasculitis
T De Vega, S Blanco, C Lopez, E Pascual, M Sanchez, A Zamarron
European Journal of Clinical Microbiology and Infectious Diseases 12, 563-563, 1993
351993
Hot carrier and hot phonon coupling during ultrafast relaxation of photoexcited electrons in graphene
JM Iglesias, MJ Martín, E Pascual, R Rengel
Applied Physics Letters 108 (4), 2016
322016
Injected current and quantum transmission coefficient in low Schottky barriers: WKB and Airy approaches
R Rengel, E Pascual, MJ Martin
IEEE electron device letters 28 (2), 171-173, 2007
202007
Experiences on the design, creation, and analysis of multimedia content to promote active learning
R Rengel, E Pascual, I Íñiguez-de-la-Torre, MJ Martín, BG Vasallo
Journal of Science Education and Technology 28, 445-451, 2019
172019
Carrier-carrier and carrier-phonon interactions in the dynamics of photoexcited electrons in graphene
JM Iglesias, MJ Martín, E Pascual, R Rengel
Journal of Physics: Conference Series 647 (1), 012003, 2015
172015
RF dynamic and noise performance of Metallic Source/Drain SOI n-MOSFETs
MJ Martin, E Pascual, R Rengel
Solid-state electronics 73, 64-73, 2012
172012
Enhanced carrier injection in Schottky contacts using dopant segregation: a Monte Carlo research
E Pascual, MJ Martín, R Rengel, G Larrieu, E Dubois
Semiconductor science and technology 24 (2), 025022, 2009
162009
Microscopic modelling of reverse biased Schottky diodes: influence of non-equilibrium transport phenomena
E Pascual, R Rengel, MJ Martín
Semiconductor science and technology 22 (9), 1003, 2007
152007
Monte Carlo study of dopant-segregated Schottky barrier SoI MOSFETs: Enhancement of the RF performance
MJ Martin-Martinez, C Couso, E Pascual, R Rengel
IEEE Transactions on Electron Devices 61 (12), 3955-3961, 2014
122014
Substrate influence on the early relaxation stages of photoexcited carriers in monolayer graphene
JM Iglesias, MJ Martín, E Pascual, R Rengel
Applied Surface Science 424, 52-57, 2017
112017
Effect of charged impurity scattering on the electron diffusivity and mobility in graphene
R Rengel, JM Iglesias, E Pascual, MJ Martin
Journal of Physics: Conference Series 647 (1), 012046, 2015
82015
Electronic transport and noise characterization in MoS2
E Pascual, JM Iglesias, MJ Martín, R Rengel
Semiconductor Science and Technology 35 (5), 055021, 2020
72020
Interplay of out-of-equilibrium phonons and self-heating under high field transport conditions in graphene
JM Iglesias, R Rengel, E Pascual, MJ Martín
Journal of Physics D: Applied Physics 50 (30), 305101, 2017
72017
A balance equations approach for the study of the dynamic response and electronic noise in graphene
R Rengel, JM Iglesias, E Pascual, MJ Martín
Journal of Applied Physics 121 (18), 2017
52017
Noise temperature in graphene at high frequencies
R Rengel, JM Iglesias, E Pascual, MJ Martín
Semiconductor Science and Technology 31 (7), 075001, 2016
52016
A Monte Carlo investigation of carrier transport in fabricated back‐to‐back Schottky diodes: Influence of direct quantum tunnelling and temperature
E Pascual, R Rengel, N Reckinger, X Tang, V Bayot, E Dubois, MJ Martín
physica status solidi c 5 (1), 119-122, 2008
52008
Monte Carlo analysis of tunneling and thermionic transport in a reverse biased Schottky diode
E Pascual, R Rengel, MJ Martin
2007 Spanish Conference on Electron Devices, 108-111, 2007
52007
Monte Carlo study of noise velocity fluctuations and microscopic carrier transport in monolayer transition metal dichalcogenides
R Rengel, Ó Castelló, E Pascual, MJ Martín, JM Iglesias
Journal of Physics D: Applied Physics 53 (39), 395102, 2020
42020
Interband scattering-induced ambipolar transport in graphene
JM Iglesias, E Pascual, MJ Martín, R Rengel
Semiconductor Science and Technology 34 (6), 065011, 2019
42019
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