| A/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods S Sunter, P Sarson 2017 IEEE International Test Conference (ITC), 1-7, 2017 | 27 | 2017 |
| An automatic approach to perform the verification of hardware designs according to the ISO26262 functional safety standard E Bagalini, J Sini, MS Reorda, M Violante, H Klimesch, P Sarson 2017 18th IEEE Latin American Test Symposium (LATS), 1-6, 2017 | 17 | 2017 |
| Automated die inking: A pattern recognition-based approach C Xanthopoulos, P Sarson, H Reiter, Y Makris 2017 IEEE International Test Conference (ITC), 1-6, 2017 | 14 | 2017 |
| Using distortion shaping technique to equalize ADC THD performance between ATEs P Sarson, H Kobayashi Journal of Electronic Testing 33 (3), 295-303, 2017 | 11 | 2017 |
| Automated die inking C Xanthopoulos, A Neckermann, P List, KP Tschernay, P Sarson, ... IEEE Transactions on Device and Materials Reliability 20 (2), 295-307, 2020 | 8 | 2020 |
| Variation and failure characterization through pattern classification of test data from multiple test stages CK Hsu, P Sarson, G Schatzberger, F Leisenberger, J Carulli, ... 2016 IEEE International Test Conference (ITC), 1-10, 2016 | 8 | 2016 |
| Online information utility assessment for per-device adaptive test flow Y Li, E Yilmaz, P Sarson, S Ozev 2018 IEEE 36th VLSI Test Symposium (VTS), 1-6, 2018 | 7 | 2018 |
| High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs G Schatzberger, FP Leisenberger, P Sarson, A Wiesner 2018 IEEE 36th VLSI Test Symposium (VTS), 1-6, 2018 | 7 | 2018 |
| Use models for extending IEEE 1687 to analog test P Sarson, J Rearick 2017 IEEE International Test Conference (ITC), 1-8, 2017 | 6 | 2017 |
| A technique for dynamic range improvement of intermodulation distortion products for an Interpolating DAC-based Arbitrary Waveform Generator using a phase switching algorithm P Sarson, S Shibuya, T Yanagida, H Kobayashi 2017 IEEE 35th VLSI Test Symposium (VTS), 1-6, 2017 | 6 | 2017 |
| Group delay filter measurement using a chirp P Sarson 2016 21th IEEE European Test Symposium (ETS), 1-2, 2016 | 6 | 2016 |
| Test time efficient group delay filter characterization technique using a discrete chirped excitation signal P Sarson 2016 IEEE International Test Conference (ITC), 1-6, 2016 | 5 | 2016 |
| RF Filter Characterization using a chirp P Sarson 2014 9th International Design and Test Symposium (IDT), 1-5, 2014 | 5 | 2014 |
| Automotive EEPROM qualification and cost optimization P Sarson, G Schatzberger, R Seitz 2013 22nd Asian Test Symposium, 105-106, 2013 | 5 | 2013 |
| A distortion shaping technique to equalize intermodulation distortion performance of interpolating arbitrary waveform generators in automated test equipment P Sarson, T Yanagida, S Shibuya, K Machida, H Kobayashi Journal of Electronic Testing 34, 215-232, 2018 | 4 | 2018 |
| Fast bit screening of automotive grade EEPROMs—Continuous improvement exercise PG Sarson, G Schatzberger, FP Leisenberger IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (4 …, 2016 | 4 | 2016 |
| Automated die inking through on-line machine learning C Xanthopoulos, A Neckermann, P List, KP Tschernay, P Sarson, ... 2019 IEEE 25th International Symposium on On-Line Testing and Robust System …, 2019 | 3 | 2019 |
| Yield improvement of an EEPROM for automotive applications while maintaining high reliability G Schatzberger, FP Leisenberger, P Sarson 2016 IEEE 34th VLSI Test Symposium (VTS), 1-6, 2016 | 3 | 2016 |
| An ATE filter characterization toolkit using a discrete chirped excitation signal as stimulus P Sarson Journal of Electronic Testing 33 (3), 283-294, 2017 | 2 | 2017 |
| Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal P Sarson, T Yanagida, K Machida Journal of Electronic Testing 34, 233-253, 2018 | 1 | 2018 |
Kwang-Ting (Tim) ChengChair Professor of ECE and CSE, HKUSTVerified email at ust.hk
