| Self-learning RF receiver systems: Process aware real-time adaptation to channel conditions for low power operation D Banerjee, B Muldrey, X Wang, S Sen, A Chatterjee IEEE Transactions on Circuits and Systems I: Regular Papers 64 (1), 195-207, 2016 | 32 | 2016 |
| Real-time use-aware adaptive RF transceiver systems for energy efficiency under BER constraints D Banerjee, SK Devarakond, X Wang, S Sen, A Chatterjee IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 25 | 2015 |
| Analog sensor based testing of phase-locked loop dynamic performance parameters SW Hsiao, X Wang, A Chatterjee 2013 22nd Asian Test Symposium, 50-55, 2013 | 22 | 2013 |
| Low cost sparse multiband signal characterization using asynchronous multi-rate sampling: Algorithms and hardware N Tzou, D Bhatta, BJ Muldrey, T Moon, X Wang, H Choi, A Chatterjee Journal of Electronic Testing 31, 85-98, 2015 | 14 | 2015 |
| Self-learning MIMO-RF receiver systems: Process resilient real-time adaptation to channel conditions for low power operation D Banerjee, B Muldrey, S Sen, X Wang, A Chatterjee 2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 710-717, 2014 | 13 | 2014 |
| Alternative “safe” test of hysteretic power converters X Wang, K Blanchard, S Estella, A Chatterjee 2014 IEEE 32nd VLSI Test Symposium (VTS), 1-6, 2014 | 10 | 2014 |
| Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise T Moon, N Tzou, X Wang, H Choi, A Chatterjee 2012 IEEE 30th VLSI Test Symposium (VTS), 146-151, 2012 | 10 | 2012 |
| Built-in test of switched-mode power converters: Avoiding DUT damage using alternative safe measurements X Wang, B Kenfack, E Silva, A Chatterjee 2013 22nd Asian Test Symposium, 56-61, 2013 | 9 | 2013 |
| Leadership in the digital age VCX TWang Educational Leadership and Organizational Management. Linking Theories to …, 2016 | 6* | 2016 |
| Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters X Wang, HW Choi, T Moon, N Tzou, A Chatterjee 2012 IEEE International Test Conference, 1-10, 2012 | 6 | 2012 |
| A self-tuning architecture for buck converters based on alternative test X Wang, K Blanchard, S Estella, A Chatterjee 2014 International Test Conference, 1-10, 2014 | 5 | 2014 |
| Low Cost Built-in Sensor Testing of Phase-Locked Loop Dynamic Parameters SW Hsiao, X Wang, A Chatterjee Journal of Electronic Testing 30, 515-526, 2014 | 4 | 2014 |
| Low cost high frequency signal synthesis: Application to RF channel interference testing X Wang, D Banerjee, A Chatterjee 2015 IEEE 33rd VLSI Test Symposium (VTS), 1-6, 2015 | 3 | 2015 |
| Dual-frequency incoherent subsampling driven test response acquisition of spectrally sparse wideband signals with enhanced time resolution N Tzou, T Moon, X Wang, H Choi, A Chatterjee 2012 IEEE 30th VLSI Test Symposium (VTS), 140-145, 2012 | 3 | 2012 |
| Low Power Adaptive Analog Front End for ECG Signal Acquisition System S Deyati, M Kar, X Wang | 1 | |
| 2015 JETTA-TTTC Best Paper Award N Tzou, D Bhatta, BJ Muldrey Jr, T Moon, X Wang, H Choi, A Chatterjee, ... J Electron Test 32, 659-660, 2016 | | 2016 |
| Enabling low cost test and tuning of difficult-to-measure device specifications: application to DC-DC converters and high speed devices X Wang Georgia Institute of Technology, 2015 | | 2015 |
| " Safe" built-in test and tuning of boost converters using feedback loop perturbations X Wang, K Blanchard, S Estella, A Chatterjee 2015 16th Latin-American Test Symposium (LATS), 1-6, 2015 | | 2015 |
| A Novel Compact Reconfigurable Bandpass Filter Based on CMRC Structure X Wang | | 2010 |
Debashis BanerjeeNVIDIAVerified email at gatech.edu
