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Joshua Taillon
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hyperspy/hyperspy: Release v1. 7.0
F De La Peņa, E Prestat, V Tonaas Fauske, P Burdet, J Lähnemann, ...
Zenodo, 2022
220*2022
Electron microscopy (big and small) data analysis with the open source software package HyperSpy
F de la Peņa, T Ostasevicius, VT Fauske, P Burdet, P Jokubauskas, ...
Microscopy and Microanalysis 23 (S1), 214-215, 2017
882017
Improving microstructural quantification in FIB/SEM nanotomography
JA Taillon, C Pellegrinelli, Y Huang, ED Wachsman, LG Salamanca-Riba
Ultramicroscopy 184 (A), 24, 2018
542018
Near-field optical properties of fully alloyed noble metal nanoparticles
C Gong, MRS Dias, GC Wessler, JA Taillon, LG Salamanca-Riba, ...
Adv. Opt. Mater 5 (1), 1600568, 2017
532017
Systematic structural and chemical characterization of the transition layer at the interface of NO-annealed 4H-SiC/SiO2 metal-oxide-semiconductor field-effect transistors
JA Taillon, J Hyuk Yang, CA Ahyi, J Rozen, JR Williams, LC Feldman, ...
Journal of Applied Physics 113 (4), 2013
452013
Long-term Cr poisoning effect on LSCF-GDC composite cathodes sintered at different temperatures
C Xiong, JA Taillon, C Pellegrinelli, YL Huang, LG Salamanca-Riba, ...
Journal of The Electrochemical Society 163 (9), F1091, 2016
322016
Towards a fundamental understanding of the cathode degradation mechanisms
ED Wachsman, YL Huang, C Pellegrinelli, JA Taillon, ...
ECS Transactions 61 (1), 47, 2014
202014
Characterization of zinc carboxylates in an oil paint test panel
C Romano, T Lam, GA Newsome, JA Taillon, N Little, J Tsang
Studies in Conservation 65 (1), 14-27, 2020
172020
Boron-doped few-walled carbon nanotubes: novel synthesis and properties
C Preston, D Song, JA Taillon, J Cumings, L Hu
Nanotechnology 27 (44), 445601, 2016
142016
Hyperspy
F de la Peņa, T Ostasevicius, VT Fauske, P Burdet, P Jokubauskas, ...
Hyperspy: hyperspy, 1-3, 2017
122017
Investigating the relationship between operating conditions and SOFC cathode degradation
C Pellegrinelli, YL Huang, JA Taillon, LG Salamanca-Riba, ...
ECS Transactions 68 (1), 773, 2015
122015
NexusLIMS: a laboratory information management system for shared-use electron microscopy facilities
JA Taillon, TF Bina, RL Plante, MW Newrock, GR Greene, JW Lau
Microscopy and Microanalysis 27 (3), 511-527, 2021
112021
Three dimensional microstructural characterization of cathode degradation in SOFCs using focused ion beam and SEM
JA Taillon, C Pellegrinelli, Y Huang, ED Wachsman, LG Salamanca-Riba
ECS Transactions 61 (1), 109, 2014
72014
Analysis of the electronic and chemical structure in boron and phosphorus passivated 4H-SiC/SiO2 interfaces using HRTEM and STEM-EELS
JA Taillon, CJ Klingshirn, C Jiao, Y Zheng, S Dhar, TS Zheleva, AJ Lelis, ...
Applied Physics Letters 113, 193503, 2018
62018
Advanced analytical microscopy at the nanoscale: Applications in wide bandgap and solid oxide fuel cell materials
JA Taillon
University of Maryland, College Park, 2016
62016
A study of SOFC cathode degradation in H2O environments
C Pellegrinelli, YL Huang, JA Taillon, LG Salamanca-Riba, ...
ECS Transactions 64 (2), 17, 2014
62014
Hyperspy/hyperspy: Release v1. 6.1
FDL Peņa, E Prestat, VT Fauske, P Burdet, T Furnival, P Jokubauskas, ...
Zenodo. https://doi. org/10.5281/ZENODO, 2020
52020
Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using FIB/SEM and TEM
JA Taillon, C Pellegrinelli, Y Huang, E Wachsman, L Salamanca-Riba
Microscopy and Microanalysis 21, 2161, 2015
42015
Characterization of the Oxide-Semiconductor Interface in 4H-SiC/SiO2 Structures using TEM and XPS
JA Taillon, K Gaskell, G Liu, L Feldman, S Dahr, T Zheleva, A Lelis, ...
Microscopy and Microanalysis 21, 1537, 2015
42015
Harvesting microscopy experimental context with a configurable laboratory information management system
JA Taillon, RF Devers, RL Plante, MW Newrock, JW Lau, G Greene
Microscopy and Microanalysis 25 (S2), 140-141, 2019
32019
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