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IGNACIO MARTIL DE LA PLAZA
IGNACIO MARTIL DE LA PLAZA
Full Professor
Verified email at ucm.es
Title
Cited by
Cited by
Year
Optical properties and structure of HfO2 thin films grown by high pressure reactive sputtering
FL Martínez, M Toledano-Luque, JJ Gandía, J Cárabe, W Bohne, ...
Journal of Physics D: Applied Physics 40 (17), 5256, 2007
2302007
Lifetime recovery in ultrahighly titanium-doped silicon for the implementation of an intermediate band material
E Antolín, A Martí, J Olea, D Pastor, G González-Díaz, I Mártil, A Luque
Applied Physics Letters 94 (4), 2009
1712009
Optical-constant calculation of non-uniform thickness thin films of the Ge10As15Se75 chalcogenide glassy alloy in the sub-band-gap region (0.1–1.8 eV)
E Marquez, AM Bernal-Oliva, JM Gonzalez-Leal, R Prieto-Alcon, ...
Materials chemistry and physics 60 (3), 231-239, 1999
1041999
Titanium doped silicon layers with very high concentration
J Olea, M Toledano-Luque, D Pastor, G González-Díaz, I Mártil
Journal of Applied Physics 104 (1), 2008
1032008
A comparative study of the electrical properties of TiO2 films grown by high-pressure reactive sputtering and atomic layer deposition
S Duenas, H Castán, H García, E San Andrés, M Toledano-Luque, I Mártil, ...
Semiconductor science and technology 20 (10), 1044, 2005
1022005
Rapid thermal annealing effects on the structural properties and density of defects in and films deposited by electron cyclotron resonance
E San Andrés, A Del Prado, FL Martınez, I Mártil, D Bravo, FJ López
Journal of Applied Physics 87 (3), 1187-1192, 2000
1022000
Influence of defects on the electrical and optical characteristics of blue light-emitting diodes based on III–V nitrides
I Martil, E Redondo, A Ojeda
Journal of applied physics 81 (5), 2442-2444, 1997
1011997
Capacitance measurements of pn junctions: depletion layer and diffusion capacitance contributions
ML Lucia, JL Hernandez-Rojas, C Leon, I Mártil
European journal of physics 14 (2), 86, 1993
861993
Sub-bandgap absorption in Ti implanted Si over the Mott limit
J Olea, A Del Prado, D Pastor, I Mártil, G González-Díaz
Journal of Applied Physics 109 (11), 2011
772011
High quality Ti-implanted Si layers above the Mott limit
J Olea, M Toledano-Luque, D Pastor, E San-Andrés, I Mártil, ...
Journal of Applied Physics 107 (10), 2010
722010
Room-temperature operation of a titanium supersaturated silicon-based infrared photodetector
E García Hemme, R García Hernansanz, G González Díaz, J Olea Ariza, ...
American Institute of Physics, 2014
652014
Deposition of thin films by the electron cyclotron resonance and its application to structures
S Garcia, I Martil, G Gonzalez Diaz, E Castan, S Duenas, M Fernandez
Journal of Applied Physics 83 (1), 332-338, 1998
651998
Physical properties of high pressure reactively sputtered TiO2
ES Andrés, M Toledano-Luque, A Prado, MA Navacerrada, I Mártil, ...
Journal of Vacuum Science & Technology A 23 (6), 1523-1530, 2005
642005
Optical analysis of absorbing thin films: application to ternary chalcopyrite semiconductors
JL Hernandez-Rojas, ML Lucia, I Mártil, G González-Díaz, J Santamaria, ...
Applied optics 31 (10), 1606-1611, 1992
641992
Intermediate band mobility in heavily titanium-doped silicon layers
G González Díaz, J Olea Ariza
Elsevier Science BV, 2009
632009
Influence of rapid thermal annealing processes on the properties of SiNx: H films deposited by the electron cyclotron resonance method
FL Martınez, I Mártil, G González-Dıaz, B Selle, I Sieber
Journal of non-crystalline solids 227, 523-527, 1998
591998
Two-layer Hall effect model for intermediate band Ti-implanted silicon
J Olea, G González-Díaz, D Pastor, I Mártil, A Martí, E Antolín, A Luque
Journal of Applied Physics 109 (6), 2011
582011
Isotopic study of the nitrogen-related modes in N+-implanted ZnO
L Artús, R Cuscó, E Alarcón-Lladó, G Gonzalez-Diaz, I Mártil, J Jiménez, ...
Applied physics letters 90 (18), 2007
582007
Composition and optical properties of silicon oxynitride films deposited by electron cyclotron resonance
A Del Prado, E San Andrés, FL Martınez, I Mártil, G González-Dı́az, ...
Vacuum 67 (3-4), 507-512, 2002
582002
Molecular models and activation energies for bonding rearrangement in plasma-deposited dielectric thin films treated by rapid thermal annealing
FL Martinez, A Del Prado, I Mártil, G González-Diaz, W Bohne, W Fuhs, ...
Physical Review B 63 (24), 245320, 2001
572001
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