| Efficient computation of the sensitization probability of a critical path considering process variations and path correlation PK Javvaji, S Tragoudas 2017 IEEE International Symposium on Circuits and Systems (ISCAS), 1-4, 2017 | 8 | 2017 |
| Scalable fault coverage estimation of sequential circuits without fault injection PK Javvaji, S Tragoudas, G Kondapuram 2018 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2018 | 5 | 2018 |
| Test set identification for improved delay defect coverage in the presence of statistical delays PK Javvaji, B Shanyour, S Tragoudas 2018 19th International Symposium on Quality Electronic Design (ISQED), 14-19, 2018 | 5 | 2018 |
| Test pattern generation and critical path selection in the presence of statistical delays PK Javvaji, S Tragoudas IEEE Transactions on Very Large Scale Integration (VLSI) Systems 28 (1), 163-173, 2019 | 3 | 2019 |
| On the sensitization probability of a critical path considering process variations and path correlations PK Javvaji, S Tragoudas IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (5 …, 2019 | 2 | 2019 |
| A method to model statistical path delays for accurate defect coverage PK Javvaji, S Tragoudas 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2018 | 2 | 2018 |
| Statistical Methods for Critical Paths Selection and Fault Coverage in Integrated Circuits PK Javvaji Southern Illinois University at Carbondale, 2019 | 1 | 2019 |
