| Analysis and mitigation of NBTI aging in register file: An end-to-end approach S Kothawade, K Chakraborty, S Roy 2011 12th International Symposium on Quality Electronic Design, 1-7, 2011 | 34 | 2011 |
| Analysis and mitigation of BTI aging in register file: An application driven approach S Kothawade, K Chakraborty Microelectronics Reliability 53 (1), 105-113, 2013 | 11 | 2013 |
| Mitigating NBTI in the physical register file through stress prediction S Kothawade, DM Ancajas, K Chakraborty, S Roy 2012 IEEE 30th International Conference on Computer Design (ICCD), 345-351, 2012 | 11 | 2012 |
| Analysis of intermittent timing fault vulnerability S Kothawade, K Chakraborty, S Roy, Y Han Microelectronics Reliability 52 (7), 1515-1522, 2012 | 10 | 2012 |
| Design of negative bias temperature instability (NBTI) tolerant register file S Kothawade Utah State University, 2012 | 1 | 2012 |
Koushik ChakrabortyProfessor, Utah State UniversityVerified email at usu.edu
