| Recent trends and perspectives on defect-oriented testing P Bernardi, R Cantoro, A Coyette, W Dobbeleare, M Fieback, A Floridia, ... 2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022 | 7 | 2022 |
| Testing single via related defects in digital VLSI designs N Mirabella, M Ricci, I Calà, R Lanza, M Grosso Microelectronics Reliability 120, 114100, 2021 | 4 | 2021 |
| Comparing different solutions for testing resistive defects in low-power SRAMs N Mirabella, M Grosso, G Franchino, S Rinaudo, I Deretzis, A La Magna, ... 2021 IEEE 22nd Latin American Test Symposium (LATS), 1-6, 2021 | 3 | 2021 |
| On the test of single via related defects in digital VLSI designs N Mirabella, M Ricci, M Grosso 2020 23rd International Symposium on Design and Diagnostics of Electronic …, 2020 | 3 | 2020 |
| An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells N Mirabella, M Grosso, G Franchino, S Rinaudo, I Deretzis, A La Magna, ... Electronics 11 (2), 203, 2022 | 2 | 2022 |
| Targeting different defect-oriented fault models in IC testing: an experimental approach N Mirabella, A Floridia, R Cantoro, M Grosso, M Sonza Reorda Titolo volume non avvalorato, 1-6, 2023 | | 2023 |
| A comparative overview of ATPG flows targeting traditional and cell-aware fault models N Mirabella, A Floridia, R Cantoro, M Grosso, MS Reorda 2022 29th IEEE International Conference on Electronics, Circuits and Systems …, 2022 | | 2022 |
Michelangelo GrossoSTMicroelectronics s.r.l.Email verificata su st.com
