Simulation of radiation effects in AlGaN/GaN HEMTs EE Patrick, M Choudhury, F Ren, SJ Pearton, ME Law ECS Journal of Solid State Science and Technology 4 (3), Q21, 2015 | 43 | 2015 |
Approaches to calculate the dielectric function of ZnO around the band gap E Agocs, B Fodor, B Pollakowski, B Beckhoff, A Nutsch, M Jank, P Petrik Thin Solid Films 571, 684-688, 2014 | 32 | 2014 |
Target dependent femtosecond laser plasma implantation dynamics in enabling silica for high density erbium doping J Chandrappan, M Murray, T Kakkar, P Petrik, E Agocs, Z Zolnai, ... Scientific Reports 5 (1), 14037, 2015 | 29 | 2015 |
Porosity and thickness characterization of porous Si and oxidized porous Si layers–An ultraviolet–visible–mid infrared ellipsometry study B Fodor, E Agocs, B Bardet, T Defforge, F Cayrel, D Alquier, M Fried, ... microporous and mesoporous materials 227, 112-120, 2016 | 27 | 2016 |
Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires B Fodor, T Defforge, E Agócs, M Fried, G Gautier, P Petrik Applied Surface Science 421, 397-404, 2017 | 25 | 2017 |
Bilayered (silica–chitosan) coatings for studying dye release in aqueous media: The role of chitosan properties M Dabóczi, E Albert, E Agócs, M Kabai-Faix, Z Hórvölgyi Carbohydrate polymers 136, 137-145, 2016 | 25 | 2016 |
Highly transparent ITO thin films on photosensitive glass: sol–gel synthesis, structure, morphology and optical properties L Kőrösi, S Papp, S Beke, B Pécz, R Horváth, P Petrik, E Agócs, I Dékány Applied Physics A 107, 385-392, 2012 | 23 | 2012 |
Investigation of thin polymer layers for biosensor applications A Saftics, E Agócs, B Fodor, D Patkó, P Petrik, K Kolari, T Aalto, P Fürjes, ... Applied surface science 281, 66-72, 2013 | 20 | 2013 |
Protein adsorption monitored by plasmon-enhanced semi-cylindrical Kretschmann ellipsometry B Kalas, J Nador, E Agocs, A Saftics, S Kurunczi, M Fried, P Petrik Applied Surface Science 421, 585-592, 2017 | 19 | 2017 |
Doping silica beyond limits with laser plasma for active photonic materials J Chandrappan, M Murray, P Petrik, E Agocs, Z Zolnai, A Tempez, ... Optical Materials Express 5 (12), 2849-2861, 2015 | 19 | 2015 |
Optical properties of Zr and ZrO2 P Petrik, A Sulyok, T Novotny, E Perez-Feró, B Kalas, E Agocs, T Lohner, ... Applied Surface Science 421, 744-747, 2017 | 18 | 2017 |
Plasmon-enhanced two-channel in situ Kretschmann ellipsometry of protein adsorption, cellular adhesion and polyelectrolyte deposition on titania nanostructures J Nador, B Kalas, A Saftics, E Agocs, P Kozma, L Korosi, I Szekacs, ... Optics Express 24 (5), 4812-4823, 2016 | 18 | 2016 |
Optical characterization of nanocrystals in silicon rich oxide superlattices and porous silicon E Agocs, P Petrik, S Milita, L Vanzetti, S Gardelis, AG Nassiopoulou, ... Thin Solid Films 519 (9), 3002-3005, 2011 | 18 | 2011 |
Micro-combinatorial sampling of the optical properties of hydrogenated amorphous for the entire range of compositions towards a database for … B Kalas, Z Zolnai, G Sáfrán, M Serényi, E Agocs, T Lohner, A Nemeth, ... Scientific reports 10 (1), 19266, 2020 | 16 | 2020 |
Scatterometry reference standards to improve tool matching and traceability in lithographical nanomanufacturing E Agocs, B Bodermann, S Burger, G Dai, J Endres, PE Hansen, L Nielson, ... Nanoengineering: Fabrication, Properties, Optics, and Devices XII 9556, 153-164, 2015 | 14 | 2015 |
Optical characterization of macro-, micro-and nanostructures using polarized light P Petrik, N Kumar, G Juhasz, C Major, B Fodor, E Agocs, T Lohner, ... Journal of Physics: Conference Series 558 (1), 012008, 2014 | 12 | 2014 |
Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry P Petrik, T Gumprecht, A Nutsch, G Roeder, M Lemberger, G Juhasz, ... Thin Solid Films 541, 131-135, 2013 | 12 | 2013 |
Atomic layer deposition and characterization of Zn-doped Ga2O3 films Z Baji, I Cora, ZE Horváth, E Agócs, Z Szabó Journal of Vacuum Science & Technology A 39 (3), 2021 | 11 | 2021 |
Enhancing optical microscopy illumination to enable quantitative imaging E Agocs, RK Attota Scientific reports 8 (1), 4782, 2018 | 10 | 2018 |
Resolving lateral and vertical structures by ellipsometry using wavelength range scan P Petrik, E Agocs, J Volk, I Lukacs, B Fodor, P Kozma, T Lohner, S Oh, ... Thin Solid Films 571, 579-583, 2014 | 10 | 2014 |