| Thin films A Ulman Academic Pr, 1998 | 360* | 1998 |
| In situ studies of thiol self-assembly on gold from solution using atomic force microscopy S Xu, SJN Cruchon-Dupeyrat, JC Garno, GY Liu, G Kane Jennings, ... The Journal of chemical physics 108 (12), 5002-5012, 1998 | 284 | 1998 |
| Precise positioning of nanoparticles on surfaces using scanning probe lithography JC Garno, Y Yang, NA Amro, S Cruchon-Dupeyrat, S Chen, GY Liu Nano Letters 3 (3), 389-395, 2003 | 191 | 2003 |
| Methods and apparatus for ink delivery to nanolithographic probe systems S Cruchon-Dupeyrat, M Nelson, R Elghanian, JS Fragala, I Touzov, ... US Patent 7,034,854, 2006 | 137 | 2006 |
| Methods for additive repair of phase shift masks by selectively depositing nanometer-scale engineered structures on defective phase shifters P Van Crocker, S Cruchon-Dupeyrat, L Demers, R Elghanian, S Disawal, ... US Patent 7,691,541, 2010 | 122 | 2010 |
| Three-dimensional nanostructure construction via nanografting: positive and negative pattern transfer JF Liu, S Cruchon-Dupeyrat, JC Garno, J Frommer, GY Liu Nano Letters 2 (9), 937-940, 2002 | 114 | 2002 |
| Direct-write nanolithography method of transporting ink with an elastomeric polymer coated nanoscopic tip to form a structure having internal hollows on a substrate H Zhang, R Elghanian, L Demers, N Amro, S Disawal, ... US Patent 7,491,422, 2009 | 81 | 2009 |
| Micrometric direct-write methods for patterning conductive material and applications to flat panel display repair S Cruchon-Dupeyrat, H Zhang, R Elghanian, L Demers, N Amro, ... US Patent 8,071,168, 2011 | 79 | 2011 |
| Imaging nanoscopic elasticity of thin film materials by atomic force microscopy: effects of force modulation frequency and amplitude JS Jourdan, SJ Cruchon-Dupeyrat, Y Huan, PK Kuo, GY Liu Langmuir 15 (19), 6495-6504, 1999 | 69 | 1999 |
| Nanofabrication using computer-assisted design and automated vector-scanning probe lithography S Cruchon-Dupeyrat, S Porthun, GY Liu Applied Surface Science 175, 636-642, 2001 | 59 | 2001 |
| High throughput inspecting M Nelson, S Cruchon-Dupeyrat, B Rosner, C Loiret-Bernal US Patent App. 11/519,199, 2010 | 49 | 2010 |
| Stamps with micrometer-and nanometer-scale features and methods of fabrication thereof JS Fragala, C Loiret-Bernal, H Zhang, RR Shile, B Rosner, ... US Patent 8,069,782, 2011 | 36 | 2011 |
| Protosubstrates S Cruchon-Dupeyrat, M Nelson, J Rendlen, J Fragala US Patent 7,199,305, 2007 | 32 | 2007 |
| Nanolithographic calibration methods SC Dupeyrat, M Nelson, RK Eby US Patent 7,060,977, 2006 | 26 | 2006 |
| Apparatus and methods for preparing identification features including pharmaceutical applications C Loiret-Bernal, B Rosner, S Cruchon-Dupeyrat, JE Bussan, M Nelson US Patent App. 11/305,327, 2010 | 25 | 2010 |
| Methods and apparatus for ink delivery to nanolithographic probe systems S Cruchon-Dupeyrat, M Nelson, R Elghanian, JS Fragala, I Touzov, ... US Patent 7,762,638, 2010 | 20 | 2010 |
| Contact resonance imaging—a simple approach to improve the resolution of AFM for biological and polymeric materials K Wadu-Mesthrige, NA Amro, JC Garno, S Cruchon-Dupeyrat, GY Liu Applied surface science 175, 391-398, 2001 | 20 | 2001 |
| Identification features C Loiret-Bernal, L Demers, B Rosner, M Nelson, R Eby, JS Fragala, ... US Patent 8,235,302, 2012 | 18 | 2012 |
| Stamps with micrometer-and nanometer-scale features and methods of fabrication thereof JS Fragala, C Loiret-Bernal, H Zhang, RR Shile, B Rosner, ... US Patent 8,387,529, 2013 | 17 | 2013 |
| Overt authentication features for compositions and objects and methods of fabrication and verification thereof C Loiret-Bernal, S Cruchon-Dupeyrat, B Rosner US Patent App. 11/305,189, 2010 | 15 | 2010 |
Gang-Yu LiuProfessor of Chemistry, University of California, DavisVerified email at ucdavis.edu
