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Paul WitherellNISTVerified email at nist.gov
Zhuo YangNational Institute of Standards and TechnologyVerified email at nist.gov
Mohsen A JafariRutgers universityVerified email at rci.rutgers.edu
Sundar KrishnamurtyProfessor of Mechanical and Industrial Engineering at UMass AmhrestVerified email at ecs.umass.edu
Zhen SongSiemens Corporation, Corporate TechnologyVerified email at siemens.com
Dr. Kun JiSiemensVerified email at siemens.com
Dr. Dong WeiResearch Scientist, Siemens Corporation, Corporate TechnologyVerified email at siemens.com
Paul SkarePNNLVerified email at pnnl.gov
Jacob (Jack) BrouwerUniversity of California, IrvineVerified email at uci.edu
Feng JuAssociate Professor of Industrial Engineering, Arizona State UniversityVerified email at asu.edu
KC MorrisNISTVerified email at nist.gov
A. VaghefiVerified email at rutgers.edu
Ian GrosseProfessor of Mechanical & Industrial Engineering, University of Massachusetts AmherstVerified email at ecs.umass.edu
Sisi LiAssistant Professor of Computer Science, Mercy CollegeVerified email at mercy.edu
MengChu ZhouNJITVerified email at njit.edu
Shaw FengNISTVerified email at nist.gov
Linxia LiaoGE DigitalVerified email at ge.com
Amit ChakrabortyHead, Predictive Analytics, Siemens Corporation, Corporate TechnologyVerified email at siemens.com
Yuebin YuUniversity of Nebraska-LincolnVerified email at unl.edu
Mohammad Abdullah Al FaruqueProfessor of University of California IrvineVerified email at uci.edu